Bookmark and Share
Home > Specialty Materials > Wafer Probe Station
Wafer Probe Station

Wafer Probe Station

wafer probe station
Item Description

To meet the needs of advanced node device manufacturing is driving a rise in fab capacity, we provide chuck size 4 inch/6inch/8inch wafer probe station for testing application in semiconductor industry. 

4inch Specifications   
 
Chuck size     
4 inch  
Chuck range          
X-Y range 4" x4"
Chuck resolution  
10micron
Chuck rotation angle and rosolution 
0~360 °,0.01°
Platen            
6 micropostioner available

 

 

 

6 inch Specifications   
 
Chuck size     
6inch   
Chuck range          
X-Y range 6" x6"
Chuck resolution  
10micron
Chuck rotation angle and rosolution 
0~360 °,0.01°
Platen            
8 micropostioner available 
Microscope X-Y range
 
2" x2" and 10micron resolution

 

8inch Specifications   
 
Chuck size     
8inch  
Chuck range          
X-Y range 8" x8"
Chuck resolution  
1micron
Chuck rotation angle and rosolution 
0~360 °,0.01°
Platen            
8 micropostioner available 
Microscope X-Y range
Microscope tilt for fast object change   
Platen quick up and down range
Platen precise up and down range and resolution
 
Requirment  
2" x2" and 10micron resolution
20°
6mm
25mm with 1micron resolution 
Power 
220 VAC, 60Hz   
 
 
 
 
 
Optional Parts   
 
Chuck quick move-out mechanism
Laser cutting and repairing 
Low temprature chuck
 
Fixture for integrator sphere 
 
Fixture for PCB,LCD etc .
 
Mircroscope tilt mechanism

Wafer probe station has a wide variety of applications such as I-V/C-V, radio frequency, millimeter-wave and sub-THz measurements, device and wafer characterization testes, failure analysis, submicron probing, MEMS, optoelectronic engineering tests and more. For further information, please contact with our sales team sales@powerwaywafer.com

 

 

 

 


Related products:
Prev:Silicon Nitride TEM window Next:Lithium Niobate Wafer