100mm (4 Inch) Silicon Wafers-2

PAM XIAMEN offers 100mm Si wafers. Please send us email at sales@powerwaywafer.com if you need other specs and quantity.

Item Material Orient. Diam
(mm)
Thck
(μm)
Surf. Resistivity
Ωcm
Comment
PAM2383 n–type Si:P [111] ±0.5° 4″ 630 P/G FZ >7,000 SEMI Prime, 1Flat, in Empak, Lifetime>1,000μs, Back–side Fine Ground
PAM2384 n–type Si:P [111] ±0.5° 4″ 675 P/E FZ >7,000 SEMI, 1Flat, Lifetime>1,600μs, in Empak cassettes of 6 and 8 wafers
PAM2385 n–type Si:P [111] ±0.5° 4″ 675 P/E FZ >7,000 SEMI, 1Flat, in Empak, Lifetime>1,600μs
PAM2386 n–type Si:P [111] ±0.5° 4″ 675 P/E FZ >7,000 SEMI TEST (Scratches, in Unsealed Empak cassette), 1Flat, Lifetime>1,600μs
PAM2387 n–type Si:P [111] ±0.25° 4″ 675 P/E FZ 7,000–10,000 SEMI Prime, 1Flat, in Empak, Lifetime>1,000μs, Light scratches
PAM2388 n–type Si:P [111] ±0.5° 4″ 150 ±10 BROKEN FZ 5,000–10,000 Broken P/E wafers, in Empak
PAM2389 n–type Si:P [111] ±0.5° 4″ 525 P/E FZ >5,000 SEMI Prime, 1Flat, Lifetime>1,000μs, Empak cst
PAM2390 n–type Si:P [111–1° towards[110]] ±0.5° 4″ 525 P/E FZ >5,000 SEMI TEST (scratches on back–side), 1Flat, Empak cst
PAM2391 n–type Si:P [111] ±0.25° 4″ 675 P/E FZ 5,000–7,000 SEMI Prime, 1Flat, in Empak, Lifetime>1,000μs
PAM2392 n–type Si:P [111] ±0.25° 4″ 675 P/E FZ 5,000–7,000 SEMI TEST (light scratches), 1Flat, Lifetime>1,000μs, in Empak
PAM2393 n–type Si:P [111] ±0.5° 4″ 525 P/P FZ >3,000 SEMI Prime, 2Flats, Lifetime>1,000μs, Empak cst
PAM2394 n–type Si:P [111] ±0.5° 4″ 525 P/P FZ >3,000 SEMI Prime, 1Flat (32.5mm)
PAM2395 n–type Si:P [111] ±0.5° 4″ 525 P/P FZ >3,000 SEMI Prime, 2Flats, Lifetime>1,000μs, in Empak cassettes of 5, & 10 wafers
PAM2396 n–type Si:P [111] ±0.25° 4″ 525 P/E FZ 3,000–5,000 SEMI Prime, 1Flat, in Empak cassettes of 3, 3 & 4 wafers
PAM2397 n–type Si:P [111] ±0.25° 4″ 525 P/E FZ 3,000–5,000 SEMI TEST (light scratches), 1Flat, Empak cst
PAM2398 n–type Si:P [111] ±0.5° 4″ 290 ±10 P/P FZ 2,500–3,500 SEMI TEST (Surface defects), 2Flats, Empak cst
PAM2399 n–type Si:P [111] ±1° 4″ 380 P/E FZ 2,000–3,000 SEMI Prime, 1Flat, TTV<5μm, Lifetime>1,000μs, in Epak cassettes of 6 wafers
PAM2400 n–type Si:P [111] ±0.5° 4″ 525 P/E FZ 1,500–3,000 SEMI Prime, 1Flat, in Empak, Lifetime>1,100μs
PAM2401 n–type Si:P [111] ±0.5° 4″ 200 P/P FZ 430–550 SEMI Prime, 1Flat, Empak cst
PAM2402 n–type Si:P [111] ±0.5° 4″ 525 P/E FZ 430–550 SEMI Prime, 1Flat, Empak cst, TTV<7μm
PAM2403 n–type Si:P [111] ±0.5° 4″ 525 P/E FZ 430–550 SEMI Prime, 1Flat, Empak cst, TTV<7μm
PAM2404 n–type Si:P [111] ±1° 4″ 475 P/E FZ 400–800 Polished but unsealed and dirty. Can be polished and cleaned for additional charge. SEMI, 1Flat, Empak cst
PAM2405 n–type Si:P [111] ±0.5° 4″ 500 ±13 E/E FZ 6.03–7.37 SEMI, 2Flats
PAM2406 n–type Si:P [111] ±0.5° 4″ 1000 P/P FZ 0.011–0.013 Prime, NO Flats, Empak cst
PAM2407 n–type Si:P [112–3° towards[11–1]] ±0.5° 4″ 762 P/P FZ >100 SEMI Prime, 1Flat, Empak cst
PAM2408 n–type Si:P [112–5° towards[11–1]] ±0.5° 4″ 762 P/P FZ ~100 SEMI Prime, 1Flat, Empak cst, TTV<3μm
PAM2409 n–type Si:P [112–5° towards[11–1]] ±0.5° 4″ 765 P/P FZ ~100 SEMI Prime, 1Flat, Empak cst, TTV<3μm
PAM2410 n–type Si:P [112–5° towards[11–1]] ±0.5° 4″ 795 E/E FZ >100 SEMI, 1Flat, in Empak, TTV<4μm, Lifetime>2,000μs
PAM2411 Intrinsic Si:– [110] 4″ 500 P/P FZ >20,000 SEMI Test (Both sides with defects), 2Flats @ [111] — Secondary 70.5° CCW from Primary, Empak cst
PAM2412 Intrinsic Si:– [100] 4″ 500 P/P FZ >30,000 SEMI Prime, 1Flat, Empak cst, TTV<5μm
PAM2413 Intrinsic Si:– [100] 4″ 300 P/P FZ >20,000 SEMI Prime, 1Flat, Empak cst, TTV<5μm
PAM2414 Intrinsic Si:– [100] 4″ 400 P/P FZ >20,000 SEMI Prime, 1Flat, Empak cst
PAM2415 Intrinsic Si:– [100] 4″ 500 P/P FZ >20,000 SEMI Test, 1Flat, Empak cst, TTV<3μm, Scratches on both sides
PAM2416 Intrinsic Si:– [100] 4″ 525 P/P FZ >20,000 SEMI Prime, 1Flat, Empak cst, Super Low TTV<0.3μm over entire wafer
PAM2417 Intrinsic Si:– [100] 4″ 525 P/E FZ >20,000 SEMI Prime, 1Flat, Empak cst, TTV<5μm
PAM2418 Intrinsic Si:– [100] 4″ 525 P/E FZ >20,000 SEMI Prime, 1Flat, Empak cst, TTV<5μm
PAM2419 Intrinsic Si:– [100] 4″ 1000 P/P FZ >20,000 Prime, 1Flat, Empak cst
PAM2420 Intrinsic Si:– [100] 4″ 1000 P/P FZ >20,000 Prime, 1Flat, Empak cst
PAM2421 Intrinsic Si:– [100] 4″ 300 P/E FZ 16,000–20,000 SEMI Prime, 1Flat, Empak cst, Back–side polish is imperfect
PAM2422 Intrinsic Si:– [100] 4″ 500 P/E FZ 13,000–20,000 SEMI Prime, 1Flat, Empak cst, TTV<5μm, Front–side Prime polish, Back–side light polish
PAM2423 Intrinsic Si:– [100] 4″ 300 P/P FZ >10,000 SEMI Prime, 1Flat, Empak cst
PAM2424 Intrinsic Si:– [100] 4″ 500 P/E FZ >10,000 SEMI Prime, 2Flats, Empak cst, TTV<5μm
PAM2425 Intrinsic Si:– [100] 4″ 615 ±10 C/C FZ >10,000 SEMI Prime, 1Flat, Empak cst
PAM2426 Intrinsic Si:– [100] 4″ 800 C/C FZ >10,000 SEMI Prime, 1Flat, Empak cst
PAM2427 Intrinsic Si:– [100] 4″ 1000 P/P FZ >2,000 SEMI Prime, 1Flat, Empak cst
PAM2428 Intrinsic Si:– [111] ±0.5° 4″ 500 P/P FZ >25,000 SEMI Prime, 1Flat, Empak cst
PAM2429 Intrinsic Si:– [111] ±0.5° 4″ 300 P/E FZ 20,000–40,000 SEMI, 1Flat, TTV<5μm, Empak cst
PAM2430 Intrinsic Si:– [111] ±0.5° 4″ 450 P/P FZ >20,000 SEMI Prime, 1Flat, Empak cst
PAM2431 Intrinsic Si:– [111] ±0.5° 4″ 500 P/E FZ >20,000 SEMI Prime, 1Flat, Empak cst, Extra 3 free non–prime wafers included with 4 prime wafers
PAM2432 Intrinsic Si:– [111] ±0.5° 4″ 500 P/P FZ >10,000 SEMI Prime, 1Flat, Empak cst
PAM2433 p–type Si:B [110] ±0.25° 4″ 525 P/E 5–10 SEMI Prime, Primary Flat @ [111]±0.25°, S Flat @ [111]±5° 109.5° CW from PF, Empak cst

 

For more information, please visit our website: https://www.powerwaywafer.com,
send us email at sales@powerwaywafer.com and powerwaymaterial@gmail.com

Found in 1990, Xiamen Powerway Advanced Material Co., Ltd (PAM-XIAMEN) is a leading manufacturer of semiconductor material in China.PAM-XIAMEN develops advanced crystal growth and epitaxy technologies, manufacturing processes, engineered substrates and semiconductor devices.PAM-XIAMEN’s technologies enable higher performance and lower cost manufacturing of semiconductor wafer.

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