100mm (4 Inch) Silicon Wafers-5

100mm (4 Inch) Silicon Wafers-5

PAM XIAMEN offers 100mm Si wafers. Please send us email at [email protected] if you need other specs and quantity.

Item Material Orient. Diam
(mm)
Thck
(μm)
Surf. Resistivity
Ωcm
Comment
PAM2535 n–type Si:P [100] 4″ 350 P/P 20–23 SEMI Prime, 14 wafes with 2 flats, 7 with 1 flat, Empak cst
PAM2536 n–type Si:P [100] 4″ 525 P/E 10–30 SEMI, 2Flats, in Empak cassettes of 7 & 7 wafers
PAM2537 n–type Si:P [100] 4″ 5800 P/E 10–100 SEMI Prime, 2Flats, Individual cst
PAM2538 n–type Si:P [100] 4″ 5800 P/E 10–100 SEMI Prime, 2Flats, Individual cst
PAM2539 n–type Si:P [100–4° towards[111]] 4″ 525 P/E 9–11 SEMI Prime, 2Flats, Empak cst
PAM2540 n–type Si:P [100] 4″ 525 P/E 7–11 SEMI Prime, 2Flats, Empak cst
PAM2541 n–type Si:P [100] 4″ 525 P/E 7–11 SEMI Prime, 2Flats, Empak cst
PAM2542 n–type Si:P [100] 4″ 224 P/E 5–10 SEMI Flats (two), Empak cst, Cassette of 12 + 13 wafers
PAM2543 n–type Si:P [100] 4″ 224 BROKEN 5–10 SEMI Test, 2Flats, Empak cst
PAM2544 n–type Si:P [100] 4″ 500 P/P 4–6 SEMI Prime, 2Flats, Empak cst
PAM2545 n–type Si:P [100] 4″ 350 ±10 P/P 3–5 SEMI Prime, 2Flats, in Empak cassettes of 5 & 8 wafers
PAM2546 n–type Si:P [100] 4″ 350 P/P 3–5 SEMI Test, 2Flats, Empak cst, Haze, pits, scratches
PAM2547 n–type Si:P [100] 4″ 450 C/C 3–5 SEMI Prime, 2Flats, Empak cst
PAM2548 n–type Si:P [100] 4″ 525 P/E 3–9 SEMI Prime, 2Flats, Empak cst, TTV<5μm
PAM2549 n–type Si:P [100] 4″ 500 ±10 P/P 2–5 SEMI TEST (wafers have spots resembling water splashes, which do not come off), 2Flats, in hard cassettes of 4, 5 & 5 wafers
PAM2550 n–type Si:P [100] 4″ 500 ±10 P/P 2–5 SEMI Prime, 2Flats, in Empak cassettes of 6, 6 & 7 wafers
PAM2551 n–type Si:P [100] 4″ 525 ±10 P/P 2–6 SEMI Prime, 1Flat, Empak cst
PAM2552 n–type Si:P [100] 4″ 250 ±5 P/P 1–100 SEMI Prime, TTV<3μm, Empak cst
PAM2553 n–type Si:P [100] 4″ 280 ±2 P/P 1–10 SEMI Prime, 1Flat, Empak cst, TTV<2μm
PAM2554 n–type Si:P [100] 4″ 280 P/P 1–5 SEMI Prime, 2Flats, Empak cst
PAM2555 n–type Si:P [100] ±0.2° 4″ 400 ±10 P/P 1–3 SEMI Prime, 1Flat, Empak cst, TTV<5μm
PAM2556 n–type Si:P [100] 4″ 400 ±10 P/P 1–10 SEMI Prime, 2Flats, Empak cst, TTV<5μm
PAM2557 n–type Si:P [100] 4″ 400 ±5 P/P 1–10 SEMI Prime, 1Flat, Empak cst, TTV<1μm, Bow<20μm, Warp<20μm
PAM2558 n–type Si:P [100] ±1° 4″ 400 ±10 P/P 1–10 SEMI Test, 2Flats, Empak cst, TTV<5μm
PAM2559 n–type Si:P [100] 4″ 400 P/E 1–6 SEMI Prime, 2Flats, Empak cst
PAM2560 n–type Si:P [100] ±1° 4″ 465 ±10 E/E 1–3 SEMI, 1Flat, Empak cst
PAM2561 n–type Si:P [100] 4″ 500 ±10 P/P 1–100 SEMI, 2Flats, Empak cst
PAM2562 n–type Si:P [100] 4″ 525 P/E 0.3–0.5 SEMI Prime, 2Flats, Empak cst, TTV<5μm
PAM2563 n–type Si:P [100] 4″ 525 P/E 0.3–0.5 SEMI Prime, 2Flats, Empak cst
PAM2564 n–type Si:P [100] 4″ 525 P/E 0.3–0.5 SEMI Prime, 2Flats, Empak cst
PAM2565 n–type Si:P [100] 4″ 300 P/E 0.29–0.31 SEMI Prime, 2Flats, Empak cst
PAM2566 n–type Si:P [100] 4″ 200 P/P 0.10–0.15 SEMI Test, 2Flats, Empak cst, Not sealed both sides scratched
PAM2567 n–type Si:P [100] 4″ 200 P/P 0.10–0.15 SEMI Test, 2Flats, Empak cst, Both sides with scratches
PAM2568 n–type Si:P [100] 4″ 200 P/E 0.10–0.15 SEMI Prime, 2Flats, Empak cst, Front–side Prime, Back–side Test grade polish
PAM2569 n–type Si:Sb [100–6° towards[110]] ±0.5° 4″ 525 P/E 0.015–0.020 SEMI Prime, 2Flats, Empak cst
PAM2570 n–type Si:Sb [100] 4″ 305 ±3 P/P 0.010–0.025 SEMI Prime, 2Flats, Empak cst, TTV<1μm
PAM2571 n–type Si:Sb [100] 4″ 525 P/E 0.01–0.02 SEMI Prime, 2Flats, Empak cst
PAM2572 n–type Si:Sb [100] 4″ 525 P/E 0.01–0.02 SEMI Prime, 2Flats, Empak cst
PAM2573 n–type Si:As [100] 4″ 545 E/E 0.002–0.004 SEMI, 1Flat, Empak cst
PAM2574 n–type Si:As [100] 4″ 525 PlyAP/E 0.001–0.005 With layer of Al2O3, ~0.1μm or ~0.05μm thick, Wafers with a matrix of Polycrystalline Silicon dots, Empak cst,
[More Info]
PAM2575 n–type Si:As [100] 4″ 525 P/P 0.001–0.005 SEMI Prime, 1Flat, Empak cst
PAM2576 n–type Si:As [100] 4″ 525 P/E 0.001–0.005 SEMI Test (Chipped edge), 2Flats, Empak cst
PAM2577 n–type Si:As [100] 4″ 525 P/E 0.001–0.005 SEMI Prime, 2Flats, Empak cst
PAM2578 n–type Si:As [100] 4″ 525 P/E 0.001–0.005 SEMI Prime, 2Flats, Empak cst, TTV<4μm, Bow<10μm, Warp<25μm
PAM2579 n–type Si:As [100] 4″ 550 ±10 P/P 0.001–0.005 SEMI Prime, 2Flats, Empak cst
PAM2580 n–type Si:Sb [211] ±0.5° 4″ 1,500 ±15 P/P 0.01–0.02 SEMI Prime, 1Flat, Empak cst, TTV<1μm
PAM2581 n–type Si:Sb [211] ±0.5° 4″ 1600 C/C 0.01–0.02 SEMI Test, 1Flat, Empak cst, Wafers can be polished for additional fee
PAM2582 n–type Si:P [111] 4″ 1200 P/P 35–85 SEMI Prime, 2Flats, Empak cst
PAM2583 n–type Si:P [111] ±0.5° 4″ 1500 P/E >20 {24–29} SEMI Prime, 2Flats, TTV<5μm, in Empak cassettes of 2 wafers
PAM2584 n–type Si:P [111] ±0.5° 4″ 250 P/E 18–25 SEMI Prime, 2Flats, Empak cst
PAM2585 n–type Si:P [111] ±0.5° 4″ 500 P/P 11–15 SEMI Prime, 2Flats, Empak cst, Both–sides Epi Ready polished
PAM2586 n–type Si:P [111] ±0.5° 4″ 525 P/E 1–5 SEMI Prime, 2Flats, Empak cst
PAM2587 n–type Si:P [111] ±0.5° 4″ 750 P/P 1–100 SEMI Prime, 2Flats, Empak cst, TTV<5μm
PAM2588 n–type Si:P [111] ±0.5° 4″ 1000 P/E 1–10 SEMI Prime, 2Flats, in Empak cassettes of 3, 3 & 4 wafers.
PAM2589 n–type Si:P [111] ±0.5° 4″ 1000 P/E 1–10 SEMI Prime, 2Flats, Empak cst
PAM2590 n–type Si:P [111] ±0.5° 4″ 10000 P/E 1–100 {8.3–9.9} Prime, NO Flats, Individual cst, groups of 5 wafers
PAM2591 n–type Si:P [111] ±1.0° 4″ 525 P/E 0.3–50.0 SEMI Prime, 2Flats, Empak cst
PAM2592 n–type Si:P [111] ±1.0° 4″ 565 ±10 E/E 0.3–50.0 SEMI Prime, Empak cst
PAM2593 n–type Si:Sb [111] 4″ 525 P/E 0.016–0.020 SEMI Prime, 2Flats, Empak cst
PAM2594 n–type Si:Sb [111] 4″ 525 P/E 0.016–0.020 SEMI Prime, 2Flats, Empak cst

For more information, please visit our website: https://www.powerwaywafer.com,
send us email at [email protected] and [email protected]

Found in 1990, Xiamen Powerway Advanced Material Co., Ltd (PAM-XIAMEN) is a leading manufacturer of semiconductor material in China.PAM-XIAMEN develops advanced crystal growth and epitaxy technologies, manufacturing processes, engineered substrates and semiconductor devices.PAM-XIAMEN’s technologies enable higher performance and lower cost manufacturing of semiconductor wafer.

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