1-6.Refraction Index
In optics the refractive index (or index of refraction) n of a substance (optical medium) is a number that describes how light, or any other radiation, propagates through that medium.
Refractive index of materials varies with the wavelength. This is called dispersion; it causes [...]
2018-06-28meta-author
2-22.Surface Roughness
Often shortened to roughness, is a measure of the texture of a surface. It is quantified by the vertical deviations of a real surface from its ideal form. If these deviations are large, the surface is rough; if they are small the surface [...]
2018-06-28meta-author
5-4-4-1 SiC Epitaxial Growth Processes
An interesting variety of SiC epitaxial growth methodologies, ranging from liquid-phase epitaxy, molecular beam epitaxy, and chemical vapor deposition(CVD) have been investigated . The CVD growth technique is generally accepted as the most promising method for attaining epilayer reproducibility, quality, [...]
2018-06-28meta-author
5-3-2 High-Power Device Operation
The high breakdown field and high thermal conductivity of SiC coupled with high operational junction
temperatures theoretically permit extremely high-power densities and efficiencies to be realized in SiC
devices. The high breakdown field of SiC relative to silicon enables the blocking voltage region [...]
2018-06-28meta-author
5-3 Applications and Benefits of SiC Electronics
Two of the most beneficial advantages that SiC-based electronics offer are in the areas of high-temperature
and high-power device operation. The specific SiC device physics that enables high-temperature and
high-power capabilities will be examined first, by several examples of revolutionary [...]
2018-06-28meta-author
3-7. ID Correct and Major Wafer Flat
Both should be readily discernible.
2018-06-28meta-author
