2-37.Test Grade

2-37.Test Grade

2-37.Test Grade

Test Grade: A silicon carbide wafer of lower quality than Prime, and used primarily for testing processes.  SEMI indicates the bulk, surface, and physical properties required to label silicon carbide wafers as “Test Wafers”.

2018-06-28

Share this post

Related Posts

3-7. ID Correct and Major Wafer Flat

3-7. ID Correct and Major Wafer Flat Both should be readily discernible.

2018-06-28meta-author
5-4-4-3 SiC Epilayer Doping

5-4-4-3 SiC Epilayer Doping In-situ doping during CVD epitaxial growth is primarily accomplished through the introduction of nitrogen (usually) for n-type and aluminum (usually trimethyl- or triethylaluminum) for p-type epilayers . Some alternative dopants such as phosphorus and boron have also been investigated for the [...]

2018-06-28meta-author
5-6-1 SiC Optoelectronic Devices

5-6-1 SiC Optoelectronic Devices The wide bandgap of SiC is useful for realizing short-wavelength blue and ultraviolet (UV) optoelectronics. 6H-SiC-based pn junction light-emitting diodes (LEDs) were the first semiconductor devices to cover the blue portion of the visible color spectrum, and became the first SiC-based devices to [...]

2018-06-28meta-author
5-6-3 SiC High-Temperature Signal-Level Devices

Most analog signal conditioning and digital logic circuits are considered “signal level” in that individual transistors in these circuits do not typically require any more than a few milliamperes of current and <20 V to function properly. Commercially available silicon-on-insulator circuits can perform complex digital and [...]

2018-06-28meta-author
1-5.Thermal Expansion Coefficient

1-5.Thermal Expansion Coefficient Thermal expansion is the tendency of matter to change in volume in response to a change in temperature. When a substance is heated, its particles begin moving more and thus usually maintain a greater average separation. Materials which contract with increasing temperature are [...]

2018-06-28meta-author
2-23.Micropipe density

2-23.Micropipe density A micropipe, also referred to as “micropore”, “microtube”, “capillary defect “or “pinhole defect”, is a crystallographic defect in a single crystal substrate.It is a important parameter to manufacturers of silicon carbide (SiC) substrates which are used in a variety of industries such as [...]

2018-06-28meta-author