PAM XIAMEN offers Titanium Oxide TiO2 Crystal Substrates.
Main Parameters
Crystal structure
Tetragonal, Rutile
Unit cell constant
a=4.5936Å c=2.9582 Å
Density
4.26 (g/cm3)
Melting point
1870 ℃
Dielectric constants
dη/dT: a: -0.72×10^-6/k, c: -0.42×10^-6/k
Linear expansion coefficient
7.14 x 10-6 /℃ along a axis
9.19 x 10-6 /℃ along c axis
Hardness
7 (mohs)
Polishing
Single or double side polished
Size
5×5×10mm, 5×10×10mm, 10×10×0.5mm, other [...]
2019-03-15meta-author
PAM-XIAMEN has 4H SiC crystal for sale, which is for power electronic device and microwave power device. It has been found that there are over 250 polytypes of silicon carbide single crystal, but the most common polytypes are cubic close-packed 3C-SiC and hexagonal close-packed [...]
2021-07-05meta-author
Transmittance of Glass Wafer
Different Glass wafer material has different transmittance. The end user should check their detail application, and then choose corresponding glass wafer material, see below:
Transmission Rate of Jgs1 Glass Wafer
Transmission Rate of Jgs1 Glass Wafer
Transmittance of Glass Wafer
Transmission Rate of Jgs2 Glass [...]
2020-06-18meta-author
Photoluminescence and Raman studies of GaN films grown by MOCVD
The photoluminescence (PL) of high quality GaN epitaxial layer grown by MOCVD was investigated for various excitation power and temperatures from 8.3 to 300K. The PL at 8.3 K and with relatively low excitation power [...]
2013-04-01meta-author
PAM XIAMEN offers 2004nm laser diode wafers.
Available Center Wavelengths: 1970 nm – 2051 nm
Wavelength Tolerance: +/- 1nm
CW Output Power (typical): 3mW (out of fiber)
SMSR (typical): >40 dB
Optical Linewidth: < 1.5 MHz
Temperature Tuning Coefficient (typical): 0.1 nm/°C
Current Tuning Coefficient (typical): 12 pm/mA
Slope Efficiency (typical): 0.12 [...]
2019-03-13meta-author
X-ray diffraction analysis of LT-GaAs multilayer structures
Multilayer structures of low-temperature-grown GaAs(LT-GaAs) into which ultra-thin layers containing excess As are periodically introduced are grown by molecular beam epitaxy. The concentration of excess As in the ultra-thin layers is determined by the analysis of the intensity [...]