50.8mm (2 Inch) Silicon Wafers-1

50.8mm (2 Inch) Silicon Wafers-1

PAM XIAMEN offers 50.8mm Si wafers.
Please send us email at sales@powerwaywafer.com  if you need other specs and quantity.

Item Material Orient. Diam
(mm)
Thck
(μm)
Surf. Resistivity
Ωcm
Comment
PAM1947  P/B [100] 2″ 280um P/E 0-100 ohm-cm Test Grade with flat
PAM1948  N/Ph [100] 2″ 280um P/E 0-100 ohm-cm Test Grade with flat
PAM1949 P/B [100] 2″ 280um P/E 1-10 ohm-cm Prime Grade with Flat
PAM1950 N/Ph [100] 2″ 280um P/E 1-10 ohm-cm Prime Grade with Flat
PAM1951 P/B [100] 2″ 280um P/E 0.001-0.005 ohm-cm Prime Grade with Flat
PAM1952 P/B [111] 2″ 280um P/E 1-10 ohm-cm Prime Grade with Flat
PAM1953 P/B [111] 2″ 280um P/E 0.001-0.005 ohm-cm Prime Grade with Flat
PAM1954 N/As [100] 2″ 280um P/E 0.001-0.005 ohm-cm Test Grade with flat
PAM1955 P/B [100] 2″ 280um P/E 1-20 ohm-cm Test Grade with flat
PAM1956 Undoped [100] 2″ 280um P/P >10,000 ohm-cm Prime Grade
PAM1957 p-type Si:B [110] ±0.5° 2″ 279 P/E FZ >1,000 2Flats, hard cst
PAM1958 p-type Si:B [100] 2″ 300 ±15 P/P FZ 3,000–4,000 SEMI Test (Bad back–side, with scratches & edge chips, 1Flat, hard cst, TTV<7μm
PAM1959 p-type Si:B [100] 2″ 300 P/E FZ 2,800–3,300 SEMI Prime, 1Flat, hard cst, TTV<7μm
PAM1960 p-type Si:B [100] 2″ 300 P/E FZ 2,800–3,300 SEMI Prime, 1Flat, hard cst, TTV<7μm
PAM1961 p-type Si:B [100] 2″ 300 P/E FZ 2,800–3,300 SEMI Prime, 1Flat, hard cst, TTV<7μm
PAM1962 p-type Si:B [111] ±0.5° 2″ 500 P/P FZ 5,000–6,500 SEMI Test (in unsealed cassette), 1Flat
PAM1963 p-type Si:B [111] ±0.5° 2″ 275 P/E FZ 3,000–5,000 SEMI Prime, 1Flat, Lifetime>2,000μs, in hard cassettes of 5 wafers
PAM1964 p-type Si:B [111–7° towards[110]] ±0.5° 2″ 279 P/P FZ >2,000 SEMI Prime, 1Flat, hard cst
PAM1965 p-type Si:B [111] ±0.5° 2″ 331 P/E FZ 2,000–5,000 SEMI, Soft cst
PAM1966 p-type Si:B [111] ±0.5° 2″ 331 P/E FZ 2,000–5,000 SEMI TEST (Scratched), Soft cst
PAM1967 p-type Si:B [111] ±0.5° 2″ 331 P/E FZ 2,000–5,000 SEMI Prime, in Soft cassettes of 4 wafers
PAM1968 p-type Si:B [111] 2″ 381 P/E FZ 2,000–5,000 SEMI TEST (Wafers scratched and cannot be recleaned), hard cst
PAM1969 p-type Si:B [111] ±0.5° 2″ 280 ±15 P/E FZ >1,000 SEMI, 2Flats, hard cst
PAM1970 p-type Si:B [111] ±0.5° 2″ 275 P/P FZ 1–10 SEMI Prime, 1Flat, hard cst
PAM1971 n-type Si:P [110] ±1° 2″ 525 P/E FZ 5,000–10,000 SEMI Prime, Lifetime>1,000μs, Primary Flat @ [111]±0.5°, Secondary Flat @ [111] 70.5° CW from Primary, in hard cassettes of 7, 8 & 8 wafers
PAM1972 n-type Si:P [110] ±1° 2″ 525 P/E FZ 5,000–10,000 SEMI Prime, Lifetime>1,000μs, Primary Flat @ [111]±0.5°, Secondary @ [111] 70.5° CW from Primary
PAM1973 n-type Si:P [110] ±0.5° 2″ 400 P/E FZ 4,000–20,000 SEMI, 1Flat, hard cst, Lifetime>1,000μs
PAM1974 n-type Si:P [110] 2″ 900 P/E FZ 130–350 SEMI Prime, 1Flat, hard cst
PAM1975 n-type Si:P [110] ±0.5° 2″ 900 P/E FZ 50–100 SEMI Prime, hard cst, Primary Flat only at [111]±0.5°
PAM1976 n-type Si:P [100] 2″ 430 P/E FZ >5,000 Prime, hard cst, TTV<5μm
PAM1977 n-type Si:P [100] 2″ 300 P/E FZ >600 SEMI Prime, 2Flats, hard cst
PAM1978 n-type Si:P [100] 2″ 300 P/E FZ >600 {1,400–2,000} SEMI Prime, 2Flats, hard cst
PAM1979 n-type Si:P [100] 2″ 200 P/P FZ 500–1,000 SEMI, 2Flats, in hard ccassettes of 4, 5 & 5 wafers
PAM1980 n-type Si:P [100] 2″ 500 P/P FZ >200 SEMI Prime, 2Flats, hard cst
PAM1981 n-type Si:P [100] 2″ 225 P/P FZ >100 SEMI, 2Flats, Individual cst, 1 very deep scratch
PAM1982 n-type Si:P [100] 2″ 280 P/E FZ 60–90 SEMI Prime, 1Flat, hard cst
PAM1983 n-type Si:P [100] 2″ 150 P/P FZ 50–110 SEMI Prime, 2Flats, hard cst
PAM1984 n-type Si:P [111–3.5° towards[110]] ±0.5° 2″ 279 ±15 P/E FZ >2,000 SEMI Prime, 1Flat, hard cst
PAM1985 n-type Si:P [111] ±0.5° 2″ 280 P/P FZ 2,000–4,000 SEMI Prime, 1Flat, hard cst, TTV<5μm, Both–sides Epi–Ready
PAM1986 n-type Si:P [111] ±0.5° 2″ 280 P/P FZ 2,000–4,000 SEMI Prime, 1Flat, hard cst, TTV<5μm
PAM1987 n-type Si:P [111] ±0.5° 2″ 280 P/P FZ 2,000–4,000 SEMI Prime, 1Flat, hard cst
PAM1988 n-type Si:P [111] ±0.5° 2″ 300 P/P FZ 2,000–4,000 SEMI Prime, 2Flats, hard cst
PAM1989 n-type Si:P [111] ±0.5° 2″ 500 P/P FZ 650–1,000 {660–900} SEMI, 2Flats, in hard cassettes of 8 wafers
PAM1990 n-type Si:P [111] ±0.5° 2″ 500 P/P FZ 300–1,000 SEMI Prime, 2Flats, hard cst
PAM1991 n-type Si:P [111] ±0.5° 2″ 500 P/P FZ 10–55 SEMI Prime, 2Flats, hard cst
PAM1992 Intrinsic Si:- [110] ±0.5° 2″ 275 P/E FZ >20,000 SEMI Prime, 1Flat, hard cst
PAM1993 Intrinsic Si:- [110] ±0.5° 2″ 275 P/E FZ >20,000 SEMI Prime, 1Flat, hard cst
PAM1994 Intrinsic Si:- [100] 2″ 280 P/P FZ >20,000 SEMI Prime, 1Flat, hard cst
PAM1995 Intrinsic Si:- [100] 2″ 280 P/E FZ >20,000 SEMI Prime, 1Flat, hard cst
PAM1996 Intrinsic Si:- [100] 2″ 280 P/E FZ >20,000 SEMI Prime, 1Flat, hard cst, Lifetime>1,000μs; 5 Prime wafers, 8 wafers with up to 2 scratches each
PAM1997 Intrinsic Si:- [100] 2″ 280 P/E FZ >20,000 SEMI Prime, hard cst
PAM1998 Intrinsic Si:- [100] 2″ 300 P/P FZ >20,000 SEMI Prime, 1Flat, hard cst, TTV<5μm
PAM1999 Intrinsic Si:- [100] 2″ 400 P/P FZ >20,000 SEMI Prime, 1Flat, hard cst
PAM2000 Intrinsic Si:- [100] 2″ 400 P/P FZ >20,000 SEMI Prime, 1Flat, hard cst
PAM2001 Intrinsic Si:- [100] 2″ 280 ±10 P/P FZ >10,000 SEMI Prime, 2Flats, hard cst, TTV<3μm, Bow<10μm, Warp<10μm
PAM2002 Intrinsic Si:- [100] 2″ 350 P/P FZ >10,000 SEMI Test, 1Flat, hard cst, Wafers with edge chips
PAM2003 Intrinsic Si:- [100] 2″ 500 ±10 P/E FZ >10,000 SEMI Prime, 1Flat, hard cst

 

For more information, please visit our website: https://www.powerwaywafer.com,
send us email at sales@powerwaywafer.com and powerwaymaterial@gmail.com

Found in 1990, Xiamen Powerway Advanced Material Co., Ltd (PAM-XIAMEN) is a leading manufacturer of semiconductor material in China.PAM-XIAMEN develops advanced crystal growth and epitaxy technologies, manufacturing processes, engineered substrates and semiconductor devices.PAM-XIAMEN’s technologies enable higher performance and lower cost manufacturing of semiconductor wafer.

Quality is our first priority. PAM-XIAMEN has been ISO9001:2008, owns and shares four modern facories which can provide quite a big range of qualified products to meet different needs of our customers, and every order has to be handled through our rigorous quality system. Test report is provided for each shipment, and each wafer are warranty.

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