Bookmark and Share
Home > News > Optical characterization of InAs film grown on SnO2 substrate by the electrodeposition technique

Optical characterization of InAs film grown on SnO2 substrate by the electrodeposition technique


Indium arsenide films have been grown by an electrodeposition process at low temperature on a tin oxide (SnO2) substrate. X-ray diffraction studies showed that the as-grown films are poorly crystallized and heat treatment improved the crystallinity of InAs films. Atomic force microscopic measurements revealed that the InAs film surface is formed by particles for which the grain size depends on the electrolysis parameters; we have found that the grain size increases with the electrolysis current density. Absorption measurements show that the band gap energy red-shifts with increasing particle size. This result can be interpreted as a consequence of the quantum confinement effect on the carriers in the nanocrystallites.


Source:IOPscience


For more information, please visit our website:http://www.powerwaywafer.com,

send us email at angel.ye@powerwaywafer.com or powerwaymaterial@gmail.com.