PSA-01 is a portable nuclear spectrum acquisition instrument, which integrates main amplifier，multi-channel pulse analyzer and high-voltage. Its gain, high-voltage and shaping time are adjustable. With upper computer software, it can acquit nuclear spectrum, analyzing, processing and storage data. Its built-in Li-battery could charge more [...]
2019-04-25メタ著者
PAM XIAMEN は 2 インチのシリコンウェーハを提供しています。 マテリアルオリエント。 ディアム。 厚さ (μm) 表面。 抵抗率 Ωcm コメント 真性 Si:- [100-4.0°] ±0.5° 2" 400 P/E FZ >20,000 SEMI Prime、TTV<5μm 真性 Si:- [100] 2" 400 P/E FZ >20,000 SEMI Prime、 TTV<5μm 真性 Si:- [100] 2 インチ 200 P/P FZ >10,000 SEMI プライム真性 Si:- [100] 2 インチ 350 P/P FZ >10,000 SEMI テスト、エッジチップ付きウェーハ 真性 Si:- [100 ] 2 インチ 500 ±10 P/E FZ >10,000 SEMI プライム真性 Si:- [100] 2 インチ 500 ±10 P/E FZ >10,000 SEMI プライム真性 Si:- [100] 2 インチ 500 ±10 P/E FZ >10,000 SEMI Prime Intrinsic Si:- [100] 2 インチ 300 P/E FZ 5,000 ～ 10,000 SEMI Prime Intrinsic Si:- [100] 2 インチ 300 P/E FZ 5,000 ～ 10,000 SEMI Prime、2 および 5 のハード カセット内ウェーハ 真性 Si:- [111] ±0.5° 2 インチ 330 P/P FZ >20,000 SEMI 真性 Si:- [111] ±0.5° 2 インチ 330 P/P FZ >20,000 SEMI 真性 Si:- [111] [。 ..]
2019-03-07メタ著者
Semiconductor lasers in the near-infrared band (760-1060nm) based on GaAs substrates are the most mature and most widely used, and have already been commercialized. We can supply GaAs laser diode wafer for a wavelength of 940nm. Moreover, a variety of laser wafers with different wavelengths [...]
2022-07-28メタ著者
PAM XIAMEN offers 2″CZ Prime Silicon Wafer-4
Silicon wafer
Dia: 2”diameter
thickness: 280±25mm
Type: P-type (100)
Polished: one side polished
Resistivity1-10Ωcm
For more information, send us email at sales@powerwaywafer.com and powerwaymaterial@gmail.com
2021-03-16メタ著者
PAM XIAMEN offers 6″ Prime Silicon Wafer Thickness 500±25um.
6″ Si wafer
DSP
N-type
<111>
thickness 500±25um
resistivity40-100Ωcm
For more information, please visit our website: https://www.powerwaywafer.com,
send us email at sales@powerwaywafer.com and powerwaymaterial@gmail.com
Found in 1990, Xiamen Powerway Advanced Material Co., Ltd (PAM-XIAMEN) is [...]
2019-07-01メタ著者
A test report is necessary to show the compliance between custom description and our final wafers data. We will test the wafer characerization by equipment before shipment, testing surface roughness by atomic force microscope, type by Roman spectra instrument, resistivity by non-contact resistivity testing [...]
2018-08-14メタ著者
