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Thermal Oxide on Silicon

We provide thermal oxide wafer with/without Ti layer/Pt layer in diameter from 2″ to 6″,now we give examples as follows: 1) 4 inch,silicon prime/test wafer,deposited with 5000 Angstroms of silicon oxide   2) Pt layer+Ti layer+thermal oxide layer deposit on silicon wafer: 4 inch Prime grade silicon,1-20 ohm cm,500 um thick ,Single side [...]

Investigation of Te inclusions in CdZnTe crystalline material using Raman spectroscopy and IR techniques

IR images reveal that Te inclusions exist in CdZnTe crystal in the form of square, hexagonal and triangular shapes. The density of Te inclusions for sizes above 5 μm sharply varied from 2.27 × 103 cm−2 to 4.52 × 105 cm−2 with a consequent reduction in IR transmittance from ∼60.5% to ∼55% when the Te-rich volume increased to 83 ppma. Raman spectra suggested [...]

Effect of Al-induced crystallization on CdZnTe thin films deposited by radio frequency magnetron sputtering

High quality polycrystalline CdZnTe films were prepared by aluminum induced crystallization (AIC) and radio frequency (r.f.) magnetron sputtering. The crystallinity, morphology and optical property of both as-deposited and AIC samples were investigated by X-ray diffraction (XRD), and atomic force microscopy (AFM), as well as Raman and ultraviolet–visible spectrometry. The results of [...]

InP/InGaAs/InP epi wafer

When the In composition in the InGaAs material reaches 0.53, and Ga reaches 0.47, InGaAs / InP lattice matched makes it can form a heterojunction. The InGaAs / InP heterojunction structure utilizes the steps of the conduction band and valence band formed by the difference in the band gap [...]

A fracture criterion for gallium arsenide wafers

A fracture criterion for gallium arsenide wafers The fracture of single crystal gallium arsenide (GaAs) semi-conducting wafers was studied. Prismatic beam specimens, cut at different crystallographic orientations from thin wafers, were loaded to failure in four-point bending. Fracture in these crystals occurred predominantly on the {110} family of crystallographic planes. [...]