PAM-XIAMEN, an epi-provider for GaN LED on Si, can offer high performance blue and green light-emitting diode prototypes that grow 2”, 4”, 6” and 8” gallium nitride (GaN) layers based on LED wafer structure on silicon substrate as well as sapphire substrates. Silicon is a low-cost compared with sapphire substrates, [...]
2018-08-16meta-author
PAM XIAMEN offers 3″ Silicon Wafer.
Material
Orient.
Diam.
Thck
(μm)
Surf.
Resistivity
Ωcm
Comment
n-type Si:P
[100]
3″
1800
P/P
1-5
SEMI Prime, Individual cst
n-type Si:P
[100]
3″
5000
P/E
1-30
Prime, NO Flats, Individual cst
n-type Si:Sb
[100]
3″
800
P/E
0.022-0.028
SEMI Prime
n-type Si:Sb
[100]
3″
380
P/E
0.021-0.023
SEMI Prime
n-type Si:Sb
[100]
3″
500
P/E
0.021-0.022
SEMI Prime
n-type Si:As
[100]
3″
1000
P/E
0.001-0.005
SEMI Prime
n-type Si:P
[211]
3″
450
P/P
50-65
SEMI Prime
n-type Si:P
[111-4°]
3″
250
P/E
50-220
Prime, NO Flatst
n-type Si:P
[111]
3″
10000
P/E
20-60
SEMI Prime, Individual cst
n-type Si:P
[111-3°]
3″
380
P/E
19-25
SEMI Prime
n-type Si:P
[111-0.5° towards[110]] ±0.25°
3″
1400
P/E
>5
SEMI Prime, hard cst, LaserMark
n-type Si:P
[111]
3″
6000
P/E
5-10
SEMI Prime, Individual cst
n-type Si:P
[111]
3″
525
P/E
4.5-5.0
SEMI Prime
n-type Si:P
[111]
3″
500
P/P
4-6
Prime, NO [...]
2019-03-06meta-author
HEMTs evolved from Field Effect Transistors (FETs) are suitable for manufacturing monolithic microwave integrated circuits (MMICs).
HEMTs were initially generated to obtain high electron mobility in semiconductor devices at room temperature. The electron mobility of FETs is limited even with high doping levels, so high [...]
2022-07-25meta-author
We offer GaAs Epitaxial Wafers for Schottky Diode as follows:
1. GaAs Schottky Diode Epi Structures
No.1 GaAs Schottky Diode Epiwafer
Epitaxial Structure PAM210319
No.
Material
Composition
Thickness Target(um)
Thickness Tol.
C/C(cm3) Target
C/C Tol.
Dopant
Carrrier Type
4
GaAs
1.00
±10%
>5.0E18
N/A
Si
N++
3
GaAs
0.28
±10%
2.0E17
±10%
Si
N
2
Ga1-xAlxAs
x=0.50
1
±10%
—
N/A
—
—
1
GaAs
0.05
±10%
—
N/A
—
—
Substrate: 2”,3”,4″
No.2 4Inch GaAs Epitaxial Wafer for Schottky Diode
PAM210326 -SDE
No.
Material
Thickness
Doping
Doping Concentration
3
GaAs schottky contact layer
–
n
–
2
GaAs ohmic contact layer
–
–
5×10^18 cm-3
1
Low temperature GaAs
2um
–
–
0
Semi-insulating GaAs (100) [...]
Evaluation of the quality of commercial silicon carbide wafers by an optical non-destructive inspection technique
There is a great need for an in-line, high-speed and non-destructive inspection system capable of evaluating and analyzing the quality SiC wafers for SiC power devices. We have examined whether [...]
GaN LED structure grown on nano-scale patterned sapphire (Al2O3) substrate can be provided with high efficiency of photoluminescence and electroluminescence. However, because of the high customization of the epitaxial process in the InGaN/GaN-quantum wells based LED heterostructure, we cannot get the optimal solution for [...]
2022-01-06meta-author