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Effect of Al-induced crystallization on CdZnTe thin films deposited by radio frequency magnetron sputtering

High quality polycrystalline CdZnTe films were prepared by aluminum induced crystallization (AIC) and radio frequency (r.f.) magnetron sputtering. The crystallinity, morphology and optical property of both as-deposited and AIC samples were investigated by X-ray diffraction (XRD), and atomic force microscopy (AFM), as well as Raman and ultraviolet–visible spectrometry. The results of [...]

InP/InGaAs/InP epi wafer

When the In composition in the InGaAs material reaches 0.53, and Ga reaches 0.47, InGaAs / InP lattice matched makes it can form a heterojunction. The InGaAs / InP heterojunction structure utilizes the steps of the conduction band and valence band formed by the difference in the band gap [...]

A fracture criterion for gallium arsenide wafers

A fracture criterion for gallium arsenide wafers The fracture of single crystal gallium arsenide (GaAs) semi-conducting wafers was studied. Prismatic beam specimens, cut at different crystallographic orientations from thin wafers, were loaded to failure in four-point bending. Fracture in these crystals occurred predominantly on the {110} family of crystallographic planes. [...]

InGaP / GaAs Epi Wafer for Solar Cell

Thanks to GaAs tunnel junction technology, we offer epi wafers of single-junction and dual-junction InGaP / GaAs solar cells, with different structures of epitaxial layers (AlGaAs, InGaP) grown on GaAs for solar cell application. And now we offer GaAs epi wafer with InGaP tunnel junction as follows: 1. InGaP / GaAs Solar [...]

Photoluminescence-based material quality diagnostics in the manufacturing of CdZnTe ionizing radiation sensors

Photoluminescence-based material quality diagnostics in the manufacturing of CdZnTe ionizing radiation sensors A photoluminescence method was used for characterization of crystalline perfection of CdZnTe single crystals in the different stages of an up-to-date process of ionizing radiation sensor production. It was shown that the point method is an effective tool [...]