SiC Epitaxy

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SiC Epitaxy

PAM-XIAMEN provide custom thin film (silicon carbide) SiC epitaxy on 6H or 4H substrates for the development of silicon carbide devices. SiC epi wafer is mainly used for Schottky diodes, metal-oxide semiconductor field-effect transistors, junction field effect transistors, bipolar junction transistors, thyristors, GTO, and insulated gate bipolar. With a silicon carbide wafer as a substrate, a chemical vapor deposition (CVD) method is usually used to deposit a layer of single crystal on the wafer to form an epitaxial wafer. Among them, SiC epitaxy are prepared by growing silicon carbide epitaxial layers on conductive silicon carbide substrates, which can be further fabricated into power devices.

1. Spesifikasi epitaxy SiC:

Pengecualian tepi 2 mm untuk 50.8 dan 76.2 mm, pengecualian tepi 3 mm untuk 100.0 mm Catatan:

• Purata semua titik pengukuran untuk ketebalan dan kepekatan pembawa (lihat halaman 5)
• Lapisan epi jenis N <20 mikron didahului oleh lapisan penyangga n-type, 1E18, 0.5 mikron
• Tidak semua ketumpatan doping tersedia dalam semua ketebalan
• Keseragaman: sisihan piawai (σ) / purata
• Keperluan khas pada parameter epi adalah berdasarkan permintaan

2. Introduction of SiC Epitaxy

Why do We Need Silicon Carbide Epitaxial Wafer? Because different from the traditional silicon power device manufacturing process, silicon carbide power devices cannot be directly fabricated on silicon carbide single crystal materials. High-quality epitaxial materials must be grown on conductive single crystal substrates, and various devices manufactured on the SiC epitaxial wafer.

The main epitaxial technology for SiC epitaxy growth is chemical vapor deposition (CVD), which realizes a certain thickness and doped silicon carbide epitaxial material through the growth of SiC epitaxy reactor step flow. With the improvement of silicon carbide power device manufacturing requirements and withstand voltage levels, SiC epi wafer continues to develop in the direction of low defects and thick epitaxy.

In recent years, the quality of thin silicon carbide epitaxial materials (＜20 μm) has been continuously improved. The microtubule defects in the epitaxial materials have been eliminated. However, the SiC epitaxy defects, such as drop, triangle, carrot, screw dislocation, basal plane dislocation, deep-level defects, etc., become the main factor affecting device performance. With the advancement of SiC epitaxy process, the thickness of the epitaxial layer has developed from a few μm and tens of μm in the past to the current tens of μm and hundreds of μm. Thanks to the advantages of SiC over Si, the SiC epitaxy market is growing rapidly.

Since silicon carbide devices must be fabricated on epitaxial materials, basically all silicon carbide single crystal materials will be used as SiC epitaxial film to grow epitaxial materials. The technology of silicon carbide epitaxial materials has developed rapidly internationally, with the highest epitaxial thickness reaching more than 250 μm. Among them, the epitaxy technology of 20 μm and below has a high maturity. The surface defect density has been reduced to less than 1/cm2, and the dislocation density has been reduced from 105/cm2 to 103/cm2. The dislocation conversion rate of base plane is close to 100%, which has basically met the requirements of epitaxial materials for large-scale production of silicon carbide devices.

In recent years, the international 30 μm~50 μm epitaxial material technology has also matured rapidly, but due to the limitation of SiC epi market demand, the progress of industrialization has been slow. At present, industrialization company can offer silicon carbide epitaxial materials in batches, include Cree SiC epitaxy, PAM-XIAMEN SiC epitaxy, Dow Corning SiC epitaxy etc..

3.Test Methods

No.1. kepekatan pembawa: doping Net ini telah dipilih sebagai nilai purata seluruh afer menggunakan Hg siasatan CV.
No.2. Ketebalan: Ketebalan ini telah dipilih sebagai nilai purata seluruh wafer menggunakan FTIR.
kecacatan titik No.3.Large: pemeriksaan mikroskopik dilakukan pada 100X, atas optik mikroskop Olympus, atau setanding.
No.4. Pemeriksaan Kecacatan Epi atau peta kecacatan yang dilakukan di bawah KLA-Tencor Candela CS20 Optical Surface Analyzer atau SICA.
No.5. Langkah bunching: Langkah bunching dan Kekasaran sedang scaned oleh AFM (daya atom mikroskop) di kawasan x10μm 10μm

3-1:Large Point Defects Descriptions

Kecacatan yang mempamerkan bentuk yang jelas dengan mata tanpa bantuan dan> 50microns seluruh. Ciri-ciri ini termasuk pancang, zarah pengikut, cip andcraters. kecacatan titik besar kurang daripada 3 mm selain dikira sebagai satu kecacatan.

3-2:Epitaxy Defect Descriptions

SiC epitaxy defects include 3C inclusions, comet tails, carrots, particles, silicon droplets and downfall.

4. Application of SiC epitaxial wafer

pembetulan faktor kuasa (PFC)
PV penyongsang dan (bekalan kuasa tanpa gangguan) penyongsang UPS
pemacu motor
pembetulan output
Hibrid atau elektrik kenderaan
SiC Schottky Diod dengan 600V, 650V, 1200V, 1700V, 3300V boleh didapati.

Sila lihat aplikasi terperinci di bawah mengikut bidang:

5. Mechanical wafers with Epi layes: are available, such as for process monitoring, which require wafers with low bow and warpage.

150mm 4H n-jenis wafer SiC EPI

Intrinsic SiC Epilayer on Silicon carbide substrate

Why do We Need Silicon Carbide Epitaxial Wafer?

4 Inch SiC Epi Wafer

4H SiC Epitaxial Wafers