PAM XIAMEN offers (100) orientation Silicon Substrates.
Below is just a small selection. Let us know if you can use or if we can quote you on another spec.
| Item | Material | Orient. | Diam (mm) |
Thck (μm) |
Surf. | Resistivity Ωcm |
Comment |
| PAM2797 | p-type Si:B | [100] | 4″ | 220 ±10 | P/E | FZ >10,000 | SEMI Prime, 1Flat, Empak cst |
| PAM2798 | p-type Si:B | [100] | 4″ | 230 ±10 | P/E | FZ >10,000 | SEMI Prime, 1Flat, Empak cst |
| PAM2799 | p-type Si:B | [100-4° towards[110]] ±0.5° | 4″ | 525 | P/E | FZ >2,000 | SEMI Prime, 2Flats, Empak cst, TTV<5μm |
| PAM2800 | p-type Si:B | [100] | 4″ | 420 | C/C | FZ 850-900 | SEMI Prime, 2Flats, Empak cst |
| PAM2801 | p-type Si:B | [100] | 4″ | 200 ±10 | P/P | FZ 100-120 | SEMI Prime, 1Flat, Empak cst |
| PAM2802 | p-type Si:B | [100] | 4″ | 250 | P/P | FZ 1-3 {0.97-1.01} | SEMI Prime, 2Flats, Empak cst, MCC Lifetime>1,000μs. |
| PAM2803 | p-type Si:B | [100-6.0° towards[111]] ±0.5° | 4″ | 350 | P/P | FZ 1-10 | SEMI Prime, 2Flats, Empak cst |
| PAM2804 | n-type Si:P | [100] | 4″ | 400 ±10 | P/P | FZ 6,000-8,000 | SEMI Prime, 2Flats, Empak cst, TTV<5μm |
| PAM2805 | n-type Si:P | [100] | 4″ | 200 ±10 | P/P | FZ >5,000 | SEMI TEST (Scratches & defects on back-side), 1Flat, Ox<1E16/cc, C<1E16/cc, Lifetime>1,050μs, Empak cst |
| PAM2806 | n-type Si:P | [100] | 4″ | 380 | P/E | FZ 5,000-10,000 | SEMI Prime, 1Flat, Lifetime>1,000μs, in Empak cassettes of 2 wafers |
| PAM2807 | n-type Si:P | [100] | 4″ | 425 | C/C | FZ >5,000 | 2Flats (p-type flats on n-type wafers), Empak cst |
| PAM2808 | n-type Si:P | [100-1.5° towards[110]] ±0.5° | 4″ | 525 | P/E | FZ >5,000 | SEMI Prime, 2Flats, Lifetime>980μs, in Empak |
| PAM2809 | n-type Si:P | [100] | 4″ | 500 | G/G | FZ 4,300-6,300 | SEMI, 2Flats, Lifetime>1,000μs, Both sides Ground, Empak cst |
| PAM2810 | n-type Si:P | [100] | 4″ | 525 | P/E | FZ 4,200-8,000 | SEMI TEST (Bad Surface & Chips), Lifetime>1,400μs, 1Flat, in Empak cassettes of 6, 7 & 7 wafers |
| PAM2811 | n-type Si:P | [100] ±0.2° | 4″ | 380 ±10 | P/E | FZ >3,500 | SEMI TEST (in opened Empak cst), 1 Flat |
| PAM2812 | n-type Si:P | [100] | 4″ | 400 ±10 | P/P | FZ 3,100-6,800 | SEMI Prime, 2Flats, TTV<5μm |
| PAM2813 | n-type Si:P | [100] | 4″ | 200 | P/P | FZ >3,000 | SEMI Prime, 1Flat, Empak cst, MCC Lifetime > 1,000μs, |
| PAM2814 | n-type Si:P | [100] | 4″ | 400 | P/E | FZ 2,000-6,500 | SEMI Prime, 2Flats, Empak cst, Lifetime>1,000μs |
| PAM2815 | n-type Si:P | [100] | 4″ | 400 | P/E | FZ 2,000-6,500 | SEMI, 2Flats, Empak cst |
| PAM2816 | n-type Si:P | [100] | 4″ | 915 ±10 | E/E | FZ 2,000-3,000 | 1Flat at [100], Empak cst |
| PAM2817 | n-type Si:P | [100] | 4″ | 300 | L/L | FZ 1,100-1,600 | SEMI, 1Flat, Empak cst |
| PAM2818 | n-type Si:P | [100] ±1° | 4″ | 200 ±10 | P/P | FZ >1,000 | SEMI Prime, 1Flat, TTV<1μm, in Empak cst |
| PAM2819 | n-type Si:P | [100] | 4″ | 200 ±10 | BROKEN | FZ 800-1,500 | Broken P/E wafers, in various size pieces, Lifetime >1,000μs |
| PAM2820 | n-type Si:P | [100] | 4″ | 300 | L/L | FZ 800-1,500 | SEMI, 1Flat, Empak cst |
| PAM2821 | n-type Si:P | [100] | 4″ | 300 | L/L | FZ 800-1,500 | SEMI, 1Flat, Empak cst |
| PAM2822 | n-type Si:P | [100] | 4″ | 500 | P/P | FZ 400-1,000 | SEMI Prime, 1Flat, Empak cst, TTV<5μm |
| PAM2823 | n-type Si:P | [100] | 4″ | 500 | P/P | FZ 198-200 | SEMI Prime, 1Flat, Empak cst |
| PAM2824 | n-type Si:P | [100] | 4″ | 500 | P/P | FZ 50-70 | SEMI Prime, 1Flat, Empak cst |
| PAM2825 | n-type Si:P | [100] | 4″ | 570 ±10 | E/E | FZ 50-70 | SEMI Prime, 1Flat, Empak cst, lifetime>1,200μs. |
| PAM2826 | n-type Si:P | [100] | 4″ | 300 | P/P | FZ 1.2-2.0 | SEMI Prime, 2Flats, MCC Lifetime (370-420)μs, Empak cst |
| PAM2827 | n-type Si:P | [100] | 4″ | 300 | P/P | FZ 1.2-2.0 | SEMI Prime, 2Flats, MCC Lifetime (370-420)μs, Empak cst |
| PAM2828 | n-type Si:P | [100-6°] ±0.5° | 4″ | 350 | P/P | FZ 1-10 | SEMI Prime, 2Flats, Empak cst |
| PAM2829 | n-type Si:P | [100] | 4″ | 525 | P/P | FZ 1-5 | SEMI Prime, 2Flats, Empak cst |
| PAM2830 | n-type Si:P | [100-4° towards[111]] ±0.5° | 4″ | 525 | P/E | FZ 1-10 {3.2-4.0} | SEMI Prime, 2Flats, Lifetime: ~500μs, in Empak cassettes of 5 wafers |
| PAM2831 | Intrinsic Si:- | [100] | 4″ | 500 | P/P | FZ >30,000 | SEMI Prime, 1Flat, Empak cst, TTV<1μm |
| PAM2832 | Intrinsic Si:- | [100] | 4″ | 500 | P/P | FZ >30,000 | SEMI Prime, 1Flat, Empak cst, TTV<5μm |
| PAM2833 | Intrinsic Si:- | [100] | 4″ | 350 | P/P | FZ >20,000 | Prime, 1Flat, Empak cst, TTV<5μm |
| PAM2834 | Intrinsic Si:- | [100] | 4″ | 400 | P/P | FZ >20,000 | SEMI Prime, 1Flat, Empak cst |
| PAM2835 | Intrinsic Si:- | [100] | 4″ | 500 | P/P | FZ >20,000 | SEMI Test, 1Flat, Empak cst, TTV<3μm, Scratches on both sides |
| PAM2836 | Intrinsic Si:- | [100] | 4″ | 500 | P/P | FZ >20,000 | SEMI Prime, 1Flat, Empak cst, TTV<2μm |
| PAM2837 | Intrinsic Si:- | [100] | 4″ | 525 | P/P | FZ >20,000 | SEMI Prime, 1Flat, Empak cst, Super Low TTV<0.3μm over entire wafer |
| PAM2838 | Intrinsic Si:- | [100] | 4″ | 525 | P/E | FZ >20,000 | SEMI Prime, 1Flat, Empak cst, TTV<5μm |
| PAM2839 | Intrinsic Si:- | [100] | 4″ | 1000 | P/P | FZ >20,000 | Prime, 1Flat, Empak cst |
| PAM2840 | Intrinsic Si:- | [100] | 4″ | 1000 | P/P | FZ >20,000 | Prime, 1Flat, Empak cst |
For more information, please visit our website: https://www.powerwaywafer.com,
send us email at sales@powerwaywafer.com and powerwaymaterial@gmail.com
Found in 1990, Xiamen Powerway Advanced Material Co., Ltd (PAM-XIAMEN) is a leading manufacturer of semiconductor material in China.PAM-XIAMEN develops advanced crystal growth and epitaxy technologies, manufacturing processes, engineered substrates and semiconductor devices.PAM-XIAMEN’s technologies enable higher performance and lower cost manufacturing of semiconductor wafer.
Our goal is to meet all of your requirements, no matter how small orders and how difficult questions they may be,
to maintain sustained and profitable growth for every customer through our qualified products and satisfying service.