SiO2 (single crystal quartz)-7

PAM XIAMEN offers SiO2 (single crystal quartz).

Single crystal quartz wafer is an excellent substrate for microwave filters for wireless communication industries.

Conversion from the three-index system to the four as [u ‘ v ‘ w ‘ ] —> [u v t w] is accomplished by the following formulas:
           X-cut           (110), (-1-10) =  (11-20) or (22-40),               XRD 2theta is 36.56 or 77.73 degrees

           Y-cut  (100), (010) (0-10) = (10-10),(20-20) or (30-30),    XRD 2theta is 20.86,42.46,65.83 degrees

           Z-cut                  (001) = (0001),                                       XRD 2theta is 50.66 degree or 117.7 degrees
          ST-Cut,     a rotated Y-cut with rotation 42.5°
          AT-Cut,     a rotated Y-cut with rotation 35°15′

Si Single Crystal Zero Diffraction Plate for XRD

Desktop X-Ray Orientation Machine for Single Crystal Orientation Measurement

Zero Diffraction Plate for XRD: 17.8 Dia x1.0 t mm with Cavity 10 IDx0.1 mm, Si Crystal

Zero Diffraction Plate for XRD: 24.6 Dia x1.0 t mm w/ Cavity 10 ID x0.2 mm, Si Crystal

Zero Diffraction Plate for XRD sample: 24.6 Dia x 1.0 t mm with Cavity 15 ID x 0.5 mm, Si Crystal

Zero Diffraction Plate with Cavity for XRD: 22 Dia x2.0 t mm w/ Cavity 10 ID x 0.5 mm, Si Crystal

Zero Diffraction Plate with Cavity for XRD: 30 Dia x1.0 t mm w/ Cavity 20mm IDx0.5 mm, Si Crystal

Zero Diffraction Plate with Cavity for XRD: 32 Dia x2.0 t mm w/ Cavity 10 IDx0.2 mm, Si Crystal

Zero Diffraction Plate for XRD sample: 16.1 mm Dia x 1.5mm t, Si Crystal

Zero Diffraction Plate for XRD sample:15.9 mm Dia x 2.0mm t, Si Crystal

Zero Diffraction Plate for XRD sample: 24.6 mm Dia x 0.5 mm t, Si Crystal

Zero Diffraction Plate for XRD sample: 23.6mm Dia x1.0 mm t, Si Crystal

Zero Diffraction Plate for XRD sample: 23.6mm Dia x2.0 mm t, Si Crystal

Zero Diffraction Plate for XRD: 24.6mm Dia x1.0 mm t, Si Crystal

Zero Diffraction Plate for XRD: 25.49mm Dia x1.7 mm t, Si Crystal

Zero Diffraction Plate for XRD sample: 32 mm Dia x 1.0 mm t, Si Crystal

Zero Diffraction Platea 32 mm Dia. x 2.0 mm t, Si Crystal for XRD sample:

Zero Diffraction Plate for XRD sample: 20 x 18 x 1.5 mm, 2sp, Si Crystal

Zero Diffraction Plate for XRD sample: 25 x 25 x 2.0 mm, 1sp, Si Crystal

SiO2 Single Crystal Zero Diffraction Plate for XRD

Desktop X-Ray Orientation Machine for Single Crystal Orientation Measurement

Zero Diffraction Plate for XRD sample: 30 x 30 x 2.5 mm with Cavity 10 ID x 1.0 mm, 2sp, SiO2 Crystal

Zero Diffraction Plate for XRD sample: 30 x 30 x 2.5 mm with Cavity 20 ID x 1.0 mm, 2sp, SiO2 Crystal

Zero Diffraction Plate for XRD sample: 30 x 30 x 2.5 mm, 2sp, SiO2 Crystal

Zero Diffraction Plate for XRD sample: 30 x 30 x 2.5 mm, 1sp, SiO2 Crystal

Zero Diffraction Plate for XRD Sample: 25 Dia x 2.5 mm, 2sp, SiO2 Crystal

Zero Diffraction Plate for XRD Sample: 30 Dia x 2.5 mm, 2sp, SiO2 Crystal

For more information, please visit our website: https://www.powerwaywafer.com,
send us email at sales@powerwaywafer.com and powerwaymaterial@gmail.com

Found in 1990, Xiamen Powerway Advanced Material Co., Ltd (PAM-XIAMEN) is a leading manufacturer of semiconductor material in China. PAM-XIAMEN develops advanced crystal growth and epitaxy technologies, manufacturing processes, engineered substrates and semiconductor devices. PAM-XIAMEN’s technologies enable higher performance and lower cost manufacturing of semiconductor wafer.

Quality is our first priority. PAM-XIAMEN has been ISO9001:2008, owns and shares four modern facories which can provide quite a big range of qualified products to meet different needs of our customers, and every order has to be handled through our rigorous quality system.Test report is provided for each shipment, and each wafer are warranty.

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