Tag - CZT wafer

Barrier controlled carrier trapping of extended defects in CdZnTe detector

Highlights •The barrier controlled trapping model was developed around extended defects. •Electron mobility and E-field distribution were distorted by space charge depletion region. •Extended defects act as a recombination-activated region. •The relationships between extended defects and detector performance were established.Transient current techniques using alpha particle source were utilized to study the influence of [...]