Evaluation of the quality of commercial silicon carbide wafers by an optical non-destructive inspection technique
There is a great need for an in-line, high-speed and non-destructive inspection system capable of evaluating and analyzing the quality SiC wafers for SiC power devices. We have examined whether [...]
PAM XIAMEN offers 2″ silicon wafers Thickness:1000 ±25μm.
2’’ silicon wafers
Ra < 4 nm
(100)
Thickness1000 ±25μm
Doped (no requirement for resistivity and type,
resistivity and type will be shown on test report when shipment)
2 sides polished
With flat (SEMI STD)
For [...]
2019-08-22meta-författare
PAM XIAMEN offers4″ Silicon EPI Wafer-6
4″ Si epi wafer
Structure:
(Top layer intrinsic Si / Middle layer Phosphorus Doped / Ion Implantation / Si substrate)
Top layer intrinsic Si:
Resistivity≥50Ωcm,
Thickness 5μm,
Residual carrier concentration<1×1014/cm3
Middle layer Phosphorus Doped:
Resistivity around 0.025Ωcm (Phosphorous concentration 7×017/cm3),
Thickness 20μm,
Residual carrier concentration<2.1×1013/cm3
Layer with Ion Implantation: handled [...]
2019-11-01meta-författare
PAM XIAMEN offers4″ FZ Prime Silicon Wafer-8
4″ GDFZ Si wafer
N type, As doped
Orientation (100)
Thickness 250±25μm,
Resistivity 0.001-0.005Ωcm
DSP
For more information, please visit our website: https://www.powerwaywafer.com,
send us email at sales@powerwaywafer.com and powerwaymaterial@gmail.com
PAM-XIAMEN develops advanced crystal growth and epitaxy technologies, range from the first generation Germanium wafer, second generation Gallium Arsenide with [...]
2019-10-25meta-författare
SiC has, during the last few years, become increasingly important as a power-device material for high voltage applications. The thick, low-doped voltage-supporting epitaxial layer is normally grown by CVD on 4° off-cut 4H-SiC substrates at a growth rate of View the MathML source
using silane [...]
PAM XIAMEN offers 100mm Si wafers. Please send us email at sales@powerwaywafer.com if you need other specs and quantity.
Item
Material
Orient.
Diam
(mm)
Thck
(μm)
Surf.
Resistivity
Ωcm
Comment
PAM2485
p–type Si:B
[100]
4″
3000
P/E
1–100
SEMI Prime, 1Flat, Individual cst, Groups of 7 and 10 wafers
PAM2486
p–type Si:B
[100]
4″
3000
P/E
1–30
SEMI, 2Flats, Individual cst
PAM2487
p–type Si:B
[100]
4″
3175
P/P
1–10
SEMI Prime, 2Flats, Individual cst, TTV<8μm
PAM2488
p–type Si:B
[100]
4″
3175
P/P
1–10
SEMI Prime, 2Flats, Individual cst, [...]
2019-02-19meta-författare