GaN HEMT TRANCHE ÉPITAXIALE
Gallium Nitride (GaN) HEMTs (High Electron Mobility Transistors) are the next generation of RF power transistor technology. Thanks to GaN technology, PAM-XIAMEN now offer AlGaN/GaN HEMT Epi Wafer on sapphire or Silicon, and AlGaN/GaN on sapphire template.
- La description
Description du produit
GaN HEMT epitaxial wafer is a multilayer film grown epitaxially on a substrate, which usually includes a nucleation layer, a transition layer, a buffer layer, a channel layer, a barrier layer, a cap layer, and a passivation layer from bottom to top. The nucleation layer, like AlGaN or AlN, is used to prevent the substrate material from diffusing into the GaN epitaxial layer. The transition layer may contain hierarchical AlGaN, AlN/GaN superlattice or multilayer AlN to balance the stress between the GaN and the substrate. The higher the Al content in the barrier layer of AlGaN, the higher the 2DEG concentration at the heterojunction. Meanwhile, the lower the threshold voltage of the device, and the higher the current capacity. As the Al ratio increasing, the degree of heterogeneous crystal lattice mismatch will be higher, resulting in a decrease in gallium nitride HEMT electron mobility and a decrease in current capacity.
The High Electron Mobility Transistor (HEMT) is developed based on GaN with unique heterostructure and two-dimensional electron gas. The GaN HEMT advantages include high breakdown strength, low on-resistance and faster The switching speed, which is very suitable for medium and low voltage and medium and small power systems, such as travel adapters, wireless chargers, AC-DC converters, smart home appliances, etc. The epitaxial wafer with HEMT structure is more attractive currently for high-frequency converters, in which GaN HEMT breakdown voltage is 600~650 V. With the rapid development of gallium nitride HEMT epi technology, the price of GaN HEMT devices will be competitive, which can gain large GaN HEMT market for GaN HEMT manufacturers. Moreover, due to the gallium nitride HEMT reliability, it can be widely used in industrial fields, such as photovoltaic inverters, energy storage systems, and electric vehicles.
1. GaN HEMT Material: Available size:2”,4”,6”,8”:
More specific parameters of gallium nitride HEMT wafer for D-mode GaN HEMTs, E-mode GaN HEMTs, GaN HEMT power amplifier and RF, please refer to:
GaN sur Si pour la puissance, en mode D
We are expert in HEMT structure, we also offer GaN HEMT epi wafer for many years.
For silicon substrate, we need to know if you grow GaN HEMT on silicon for POWER or RF, it is different. If needed, please contact [email protected] for details.
For SiC, you should use semi-insulating.
Or you can buy AlGaN/GaN HEMT structure on these three structure from us.
2. Now we show you an example as follows:
2.1 2 "(50,8 mm) de GaN HEMT épitaxiales gaufrettes
We offer 2″(50.8mm) gallium nitride HEMT Wafers, the GaN HEMT structure is as follows:
Structure (de haut en bas):
* GaN non dopé bouchon (2 ~ 3 nm de)
AlxGa1-XN (18 ~ 40 nm)
AlN (de couche tampon)
un GaN dopé (2 ~ 3um)
substrat de saphir
* Nous pouvons utiliser Si3N pour remplacer GaN sur le dessus, l'adhésion est forte, il est revêtu par pulvérisation cathodique ou PECVD.
2.2 AlGaN/GaN HEMT Epi Wafer on sapphire/GaN
Couche # | Composition | Épaisseur | X | dopant | Concentration porteuse |
5 | GaN | 2nm | – | – | – |
4 | AlxGa1–xN | 8 nm | 0.26 | – | – |
3 | AIN | 1nm | Un dopé | ||
2 | GaN | ≥1000 nm | Un dopé | ||
1 | Tampon / Transition couche | – | – | ||
substrat | Silicium | 350 pm / 625 pm | – |
2.3 2″(50.8mm),4″ (100mm)AlGaN/GaN HEMT Epi Wafer on Si
2.3.1 Specifications for Aluminium Gallium Nitride (AlGaN) / Gallium Nitride (GaN) À haute mobilité d'électrons transistor (HEMT) sur substrat de silicium.
Exigences | Spécification |
AlGaN / GaN HEMT Epi Wafer sur Si | |
AlGaN / GaN structure HEMT | Se reporter 1.2 |
Matériau du substrat | Silicium |
Orientation | <111> |
Méthode de croissance | Zone float |
Type de Conduction | P ou N |
Taille (pouces) | 2” , 4” |
Epaisseur (um) | 625 |
Arrière | Rugueux |
Résistivité (Ω-cm) | >6000 |
Bow (pm) | ≤ ± 35 |
2.3.2 Epi structure: Crack-free Epilayers
Couche # | Composition | Épaisseur | X | dopant | Concentration porteuse |
5 | GaN | 2nm | – | – | – |
4 | AlxGa1–xN | 8 nm | 0.26 | – | – |
3 | AIN | 1nm | Un dopé | ||
2 | GaN | ≥1000 nm | Un dopé | ||
1 | Tampon / Transition couche | – | – | ||
substrat | Silicium | 350 pm / 625 pm | – |
2.3.3 Electrical Properties of the AlGaN/GaN HEMT structure
2 DEG mobilité (à 300 K): ≥1,800 cm2 / Vs
2 DEG transport de feuille Densité (à 300 K): ≥0.9 × 1013 cm-2
RMS Rugosité (AFM): ≤ 0,5 nm (zone de numérisation 5,0 pm x 5,0 pm)
2.4 2″(50.8mm)AlGaN/GaN on sapphire
Pour la spécification de AlGaN / GaN sur le modèle de saphir, s'il vous plaît contacter notre service commercial: [email protected]
GaN HEMT Applications: Used in blue laser diodes, ultraviolet LEDs (down to 250 nm), and AlGaN/GaN HEMTs device.
3. Explanation of AlGaN/Al/GaN HEMTs:
HEMT nitrures sont intensément développés pour des produits électroniques de grande puissance à haute fréquence d'amplification et des applications de commutation de puissance. Souvent, de hautes performances en fonctionnement continu est perdue lorsque le HEMT est activé - par exemple, le courant sur effondre lorsque le signal de grille est pulsé. On pense que ces effets sont liés à charger le piégeage qui masque l'effet de la porte sur le flux de courant. Field-plaques sur les électrodes de source et de grille ont été utilisées pour manipuler le champ électrique dans le dispositif, l'atténuation des phénomènes effondrement en cours.
4. GaN EpitaxialTechnology — Customized GaN epitaxy on SiC,Si and Sapphire substrate for HEMTs, LEDs:
GAN HEMT ÉPITAXIALES PLAQUETTES (GAN EPI-PLAQUETTES)
PAM XIAMEN Offers Epitaxial growth of AlGaN/GaN based HEMT on Si wafers
5. GaN Device:
GaN HEMT
6. Test Characterization Equipment:
Résistance feuille Contactless
Cartographie Laser Thin Film Epaisseur
Haute température / humidité élevée Polarisation inverse
Choc Thermique
DIC Nomarski Microscope
Microscope à force atomique (AFM)
Défectivité surface de balayage
Haute température inverse Bias
Résistance feuille 4PP
Mobilité Contactless Salle
Cycle de température
Diffraction des rayons X (XRD) / Réflectance (XRR)
Epaisseur ellipsomètre
profilomètre
CV Tester
7. Foundry Fabrication:
we also offer foundry GaN HEMT fabrication in the following process as follows:
MOCVD épitaxie
Métal pulvérisation / E-Beam
Sec / humide en métal / diélectrique Etch
Thin Film PECVD / LPCVD / pulvérisation cathodique
RTA Recuit / four
Photolithographie (0.35um min. CD)
Implantation ionique
More fabrication services, please visit: GaN Fabrication Services for HEMT Devices
Aluminium gallium arsenide epi wafer
650V GaN FETs Chip for Fast Charge
GaN MOSFET Structure:
GaN MOSFET Structure on SiC Substrate
More about GaN HEMT structures, please read: