PAM XIAMEN offers 2″CZ Prime Silicon Wafer-2 2″ Silicon Wafer Resistivity 1-5Ωcm P type, Boron doped Orientation (100) Thickness 300±25μm SSP SEMI Prime, 1Flat, Hard cst For more information, send us email at sales@powerwaywafer.com and powerwaymaterial@gmail.com
2020-06-11メタ著者
PAM XIAMEN offers PbTe single crystal substrate.(Not sell it temporarily) Lead telluride (Phoebe) is a compound of lead and tellurium (PbTe); it is a narrow gap semiconductor. It occurs naturally as the mineral altaite. It is often alloyed with tin to make lead tin telluride, [...]
2019-05-14メタ著者
PAM XIAMEN offers Diced Silicon Wafers.Wafer thickness could be customized. PAM XIAMEN and our partners provide researchers with creative silicon wafer and other substrate dicing solutions. Using precision diamond saws we can cut a variety of hard brittle materials. Our Services Include. Small quantity wafer dicing at [...]
2019-02-20メタ著者
PAM XIAMEN offers 100mm Si wafers. Please send us email at sales@powerwaywafer.com if you need other specs and quantity. Item Material Orient. Diam (mm) Thck (μm) Surf. Resistivity Ωcm Comment PAM2595 n–type Si:Sb [111–4°] ±0.5° 4″ 420 P/EOx 0.008–0.018 {0.0138–0.0151} SEMI Prime, 2Flats, Empak cst, Epi edges, TTV<2μm, HBSD+LTO seal PAM2596 n–type Si:Sb [111–4.0°] ±0.5° 4″ 475 ±15 P/E 0.005–0.020 {0.0113–0.0156} SEMI Prime, 2Flats, Empak cst PAM2597 n–type Si:As [111] 4″ 450 P/E 0.004–0.005 SEMI Prime, 1Flat, Empak cst PAM2598 n–type Si:As [111] [...]
2019-02-19メタ著者
PAM XIAMEN offers test grade silicon wafers Below is just a short list of the test grade silicon substrates! Inches Cust class Dopant Type Orientation PFL length PFL direction SFL Off orientation Resistivity Diameter Thickness Bow TTV Warp 6 SSP Arsenic N+ 100 57,5 ± 2,5 110 ± 1 0.0 ± 1.0 ° 0.0028-0.0035 Ohmcm 150 ± 0.5 mm 440 ± 20 µm 40 5 40 6 SSP Arsenic N+ 111 57,5 ± 2,5 110 ± 1 4.0 ± 0.5 ° < 0.0035 Ohmcm 150 [...]
2019-02-25メタ著者
150mm 4H n-type SiC epi wafer with excellent uniformity and extremely low defect density is available. SiC epitaxial wafer refers to a silicon carbide wafer on which a single crystal film (epitaxial layer) with certain requirements and the same crystal as the substrate is grown on a silicon [...]
2020-03-10メタ著者