PAM XIAMEN offers 100mm Si wafers. Please send us email at sales@powerwaywafer.com if you need other specs and quantity.
Item | Material | Orient. | Diam (mm) |
Thck (μm) |
Surf. | Resistivity Ωcm |
Comment |
PAM2383 | n–type Si:P | [111] ±0.5° | 4″ | 630 | P/G | FZ >7,000 | SEMI Prime, 1Flat, in Empak, Lifetime>1,000μs, Back–side Fine Ground |
PAM2384 | n–type Si:P | [111] ±0.5° | 4″ | 675 | P/E | FZ >7,000 | SEMI, 1Flat, Lifetime>1,600μs, in Empak cassettes of 6 and 8 wafers |
PAM2385 | n–type Si:P | [111] ±0.5° | 4″ | 675 | P/E | FZ >7,000 | SEMI, 1Flat, in Empak, Lifetime>1,600μs |
PAM2386 | n–type Si:P | [111] ±0.5° | 4″ | 675 | P/E | FZ >7,000 | SEMI TEST (Scratches, in Unsealed Empak cassette), 1Flat, Lifetime>1,600μs |
PAM2387 | n–type Si:P | [111] ±0.25° | 4″ | 675 | P/E | FZ 7,000–10,000 | SEMI Prime, 1Flat, in Empak, Lifetime>1,000μs, Light scratches |
PAM2388 | n–type Si:P | [111] ±0.5° | 4″ | 150 ±10 | BROKEN | FZ 5,000–10,000 | Broken P/E wafers, in Empak |
PAM2389 | n–type Si:P | [111] ±0.5° | 4″ | 525 | P/E | FZ >5,000 | SEMI Prime, 1Flat, Lifetime>1,000μs, Empak cst |
PAM2390 | n–type Si:P | [111–1° towards[110]] ±0.5° | 4″ | 525 | P/E | FZ >5,000 | SEMI TEST (scratches on back–side), 1Flat, Empak cst |
PAM2391 | n–type Si:P | [111] ±0.25° | 4″ | 675 | P/E | FZ 5,000–7,000 | SEMI Prime, 1Flat, in Empak, Lifetime>1,000μs |
PAM2392 | n–type Si:P | [111] ±0.25° | 4″ | 675 | P/E | FZ 5,000–7,000 | SEMI TEST (light scratches), 1Flat, Lifetime>1,000μs, in Empak |
PAM2393 | n–type Si:P | [111] ±0.5° | 4″ | 525 | P/P | FZ >3,000 | SEMI Prime, 2Flats, Lifetime>1,000μs, Empak cst |
PAM2394 | n–type Si:P | [111] ±0.5° | 4″ | 525 | P/P | FZ >3,000 | SEMI Prime, 1Flat (32.5mm) |
PAM2395 | n–type Si:P | [111] ±0.5° | 4″ | 525 | P/P | FZ >3,000 | SEMI Prime, 2Flats, Lifetime>1,000μs, in Empak cassettes of 5, & 10 wafers |
PAM2396 | n–type Si:P | [111] ±0.25° | 4″ | 525 | P/E | FZ 3,000–5,000 | SEMI Prime, 1Flat, in Empak cassettes of 3, 3 & 4 wafers |
PAM2397 | n–type Si:P | [111] ±0.25° | 4″ | 525 | P/E | FZ 3,000–5,000 | SEMI TEST (light scratches), 1Flat, Empak cst |
PAM2398 | n–type Si:P | [111] ±0.5° | 4″ | 290 ±10 | P/P | FZ 2,500–3,500 | SEMI TEST (Surface defects), 2Flats, Empak cst |
PAM2399 | n–type Si:P | [111] ±1° | 4″ | 380 | P/E | FZ 2,000–3,000 | SEMI Prime, 1Flat, TTV<5μm, Lifetime>1,000μs, in Epak cassettes of 6 wafers |
PAM2400 | n–type Si:P | [111] ±0.5° | 4″ | 525 | P/E | FZ 1,500–3,000 | SEMI Prime, 1Flat, in Empak, Lifetime>1,100μs |
PAM2401 | n–type Si:P | [111] ±0.5° | 4″ | 200 | P/P | FZ 430–550 | SEMI Prime, 1Flat, Empak cst |
PAM2402 | n–type Si:P | [111] ±0.5° | 4″ | 525 | P/E | FZ 430–550 | SEMI Prime, 1Flat, Empak cst, TTV<7μm |
PAM2403 | n–type Si:P | [111] ±0.5° | 4″ | 525 | P/E | FZ 430–550 | SEMI Prime, 1Flat, Empak cst, TTV<7μm |
PAM2404 | n–type Si:P | [111] ±1° | 4″ | 475 | P/E | FZ 400–800 | Polished but unsealed and dirty. Can be polished and cleaned for additional charge. SEMI, 1Flat, Empak cst |
PAM2405 | n–type Si:P | [111] ±0.5° | 4″ | 500 ±13 | E/E | FZ 6.03–7.37 | SEMI, 2Flats |
PAM2406 | n–type Si:P | [111] ±0.5° | 4″ | 1000 | P/P | FZ 0.011–0.013 | Prime, NO Flats, Empak cst |
PAM2407 | n–type Si:P | [112–3° towards[11–1]] ±0.5° | 4″ | 762 | P/P | FZ >100 | SEMI Prime, 1Flat, Empak cst |
PAM2408 | n–type Si:P | [112–5° towards[11–1]] ±0.5° | 4″ | 762 | P/P | FZ ~100 | SEMI Prime, 1Flat, Empak cst, TTV<3μm |
PAM2409 | n–type Si:P | [112–5° towards[11–1]] ±0.5° | 4″ | 765 | P/P | FZ ~100 | SEMI Prime, 1Flat, Empak cst, TTV<3μm |
PAM2410 | n–type Si:P | [112–5° towards[11–1]] ±0.5° | 4″ | 795 | E/E | FZ >100 | SEMI, 1Flat, in Empak, TTV<4μm, Lifetime>2,000μs |
PAM2411 | Intrinsic Si:– | [110] | 4″ | 500 | P/P | FZ >20,000 | SEMI Test (Both sides with defects), 2Flats @ [111] — Secondary 70.5° CCW from Primary, Empak cst |
PAM2412 | Intrinsic Si:– | [100] | 4″ | 500 | P/P | FZ >30,000 | SEMI Prime, 1Flat, Empak cst, TTV<5μm |
PAM2413 | Intrinsic Si:– | [100] | 4″ | 300 | P/P | FZ >20,000 | SEMI Prime, 1Flat, Empak cst, TTV<5μm |
PAM2414 | Intrinsic Si:– | [100] | 4″ | 400 | P/P | FZ >20,000 | SEMI Prime, 1Flat, Empak cst |
PAM2415 | Intrinsic Si:– | [100] | 4″ | 500 | P/P | FZ >20,000 | SEMI Test, 1Flat, Empak cst, TTV<3μm, Scratches on both sides |
PAM2416 | Intrinsic Si:– | [100] | 4″ | 525 | P/P | FZ >20,000 | SEMI Prime, 1Flat, Empak cst, Super Low TTV<0.3μm over entire wafer |
PAM2417 | Intrinsic Si:– | [100] | 4″ | 525 | P/E | FZ >20,000 | SEMI Prime, 1Flat, Empak cst, TTV<5μm |
PAM2418 | Intrinsic Si:– | [100] | 4″ | 525 | P/E | FZ >20,000 | SEMI Prime, 1Flat, Empak cst, TTV<5μm |
PAM2419 | Intrinsic Si:– | [100] | 4″ | 1000 | P/P | FZ >20,000 | Prime, 1Flat, Empak cst |
PAM2420 | Intrinsic Si:– | [100] | 4″ | 1000 | P/P | FZ >20,000 | Prime, 1Flat, Empak cst |
PAM2421 | Intrinsic Si:– | [100] | 4″ | 300 | P/E | FZ 16,000–20,000 | SEMI Prime, 1Flat, Empak cst, Back–side polish is imperfect |
PAM2422 | Intrinsic Si:– | [100] | 4″ | 500 | P/E | FZ 13,000–20,000 | SEMI Prime, 1Flat, Empak cst, TTV<5μm, Front–side Prime polish, Back–side light polish |
PAM2423 | Intrinsic Si:– | [100] | 4″ | 300 | P/P | FZ >10,000 | SEMI Prime, 1Flat, Empak cst |
PAM2424 | Intrinsic Si:– | [100] | 4″ | 500 | P/E | FZ >10,000 | SEMI Prime, 2Flats, Empak cst, TTV<5μm |
PAM2425 | Intrinsic Si:– | [100] | 4″ | 615 ±10 | C/C | FZ >10,000 | SEMI Prime, 1Flat, Empak cst |
PAM2426 | Intrinsic Si:– | [100] | 4″ | 800 | C/C | FZ >10,000 | SEMI Prime, 1Flat, Empak cst |
PAM2427 | Intrinsic Si:– | [100] | 4″ | 1000 | P/P | FZ >2,000 | SEMI Prime, 1Flat, Empak cst |
PAM2428 | Intrinsic Si:– | [111] ±0.5° | 4″ | 500 | P/P | FZ >25,000 | SEMI Prime, 1Flat, Empak cst |
PAM2429 | Intrinsic Si:– | [111] ±0.5° | 4″ | 300 | P/E | FZ 20,000–40,000 | SEMI, 1Flat, TTV<5μm, Empak cst |
PAM2430 | Intrinsic Si:– | [111] ±0.5° | 4″ | 450 | P/P | FZ >20,000 | SEMI Prime, 1Flat, Empak cst |
PAM2431 | Intrinsic Si:– | [111] ±0.5° | 4″ | 500 | P/E | FZ >20,000 | SEMI Prime, 1Flat, Empak cst, Extra 3 free non–prime wafers included with 4 prime wafers |
PAM2432 | Intrinsic Si:– | [111] ±0.5° | 4″ | 500 | P/P | FZ >10,000 | SEMI Prime, 1Flat, Empak cst |
PAM2433 | p–type Si:B | [110] ±0.25° | 4″ | 525 | P/E | 5–10 | SEMI Prime, Primary Flat @ [111]±0.25°, S Flat @ [111]±5° 109.5° CW from PF, Empak cst |
For more information, please visit our website: https://www.powerwaywafer.com,
send us email at sales@powerwaywafer.com and powerwaymaterial@gmail.com
Found in 1990, Xiamen Powerway Advanced Material Co., Ltd (PAM-XIAMEN) is a leading manufacturer of semiconductor material in China.PAM-XIAMEN develops advanced crystal growth and epitaxy technologies, manufacturing processes, engineered substrates and semiconductor devices.PAM-XIAMEN’s technologies enable higher performance and lower cost manufacturing of semiconductor wafer.
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