News

LED Wafer on Silicon

LED Wafer on Silicon             We offer high performance blue light-emitting diode prototypes that grow 2” gallium (GaN) layers based on LED structure on silicon substrate as well as sapphire substrates. Silicon is a low-cost compared with sapphire substrates, and large diameter silicon wafer processing is already popular in the semiconductor market, with the possibility [...]

UV LED Wafer

UV LED Wafer             We started to offer UV LED wafers that were grown by our MOCVD range from 365nm to 405nm, the detail structure is as below: P-AlGaN AlGaN EBL AlGaN/InGaN MOWs N-SLS N-AlGaN Undoped AlGaN Sapphire substrate Ultraviolet electromagnetic radiation, commonly known as UV, is used in many industries and applications. The emerging UV LED will be [...]

AlGaN template structure report

AlGaN template structure report A test report is necessary to show the compliance between custom description and our final wafers data. We will test the wafer characerization by equipment before shipment, testing surface roughness by atomic force microscope, type by Roman spectra instrument, resistivity by non-contact resistivity testing equipment,micropipe density [...]

FWHM and XRD report

FWHM and XRD report A test report is necessary to show the compliance between custom description and our final wafers data. We will test the wafer characerization by equipment before shipment, testing surface roughness by atomic force microscope, type by Roman spectra instrument, resistivity by non-contact resistivity testing equipment,micropipe density [...]

Energy resolution report

Energy resolution report A test report is necessary to show the compliance between custom description and our final wafers data. We will test the wafer characerization by equipment before shipment, testing surface roughness by atomic force microscope, type by Roman spectra instrument, resistivity by non-contact resistivity testing equipment,micropipe density by [...]

IR Transmittance Report

IR Transmittance Report A test report is necessary to show the compliance between custom description and our final wafers data. We will test the wafer characerization by equipment before shipment, testing surface roughness by atomic force microscope, type by Roman spectra instrument, resistivity by non-contact resistivity testing equipment,micropipe density by [...]

IV Test Report

IV Test Report A test report is necessary to show the compliance between custom description and our final wafers data. We will test the wafer characerization by equipment before shipment, testing surface roughness by atomic force microscope, type by Roman spectra instrument, resistivity by non-contact resistivity testing equipment,micropipe density by [...]

Surface Roughness-GaN material-TEST REPORT

Surface Roughness-GaN material-TEST REPORT A test report is necessary to show the compliance between custom description and our final wafers data. We will test the wafer characerization by equipment before shipment, testing surface roughness by atomic force microscope, type by Roman spectra instrument, resistivity by non-contact resistivity testing equipment,micropipe density [...]

Transmitance-GaN material-TEST REPORT

Transmitance-GaN material-TEST REPORT A test report is necessary to show the compliance between custom description and our final wafers data. We will test the wafer characerization by equipment before shipment, testing surface roughness by atomic force microscope, type by Roman spectra instrument, resistivity by non-contact resistivity testing equipment,micropipe density by [...]

XRD Rocking Curves-GaN Material-TEST REPORT

XRD Rocking Curves-GaN Material-TEST REPORT A test report is necessary to show the compliance between custom description and our final wafers data. We will test the wafer characerization by equipment before shipment, testing surface roughness by atomic force microscope, type by Roman spectra instrument, resistivity by non-contact resistivity testing equipment,micropipe [...]