PAM XIAMEN offers 80+1mm FZ Si Ingot-1
FZ Si Ingot
Diameter 80+1mm, N-type, <111>±2°
Resistivity>3000Ωcm
Oxygen/Carbon Content 10Е16см-3
The silicon content not less than 99.999999%
Length 150-480mm
MCC lifetime>1000μs
The dislocation density not, Swirl not
For more information, send us email at sales@powerwaywafer.com and powerwaymaterial@gmail.com
2020-03-13meta-author
Computer modeling of surface interactions and contamin
Highlights
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Dynamics of contaminant removal from the surface of micro/nanotrench is simulated.
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The trench is rectangular and made of one or two different materials.
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Various diffusivities and surface characteristics are considered in the model.
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In multimaterial trench, cleaning dynamics strongly depends on [...]
PAM XIAMEN offers 4″ CZ Prime Silicon Wafer.
4″ epi CZ P-type (100)±0.5°
Thickness 525±15μm
Resistivity 0.015±0.005Ωcm
For more information, please visit our website: https://www.powerwaywafer.com,
send us email at sales@powerwaywafer.com and powerwaymaterial@gmail.com
Found in 1990, Xiamen Powerway Advanced Material Co., Ltd (PAM-XIAMEN) is a [...]
2019-06-28meta-author
PAM XIAMEN offers Silicon Ingots.
Material Description
5″Ø×420mm n-type Si:As[100], Ro=(0.0032-0.0034)Ohmcm
5″Ø (5 ingots: 540mm, 254mm, 607mm, 644mm, 201mm), n-type Si:As[100], (0.001-0.007)Ohmcm
5″Ø×375mm ingot n-type Si:As[100], Ro=(0.0021-0.0039)Ohmcm
5″Ø×330mm ingot n-type Si:As[100], Ro=(0.0022-0.0040)Ohmcm
5″Ø×416mm ingot n-type Si:As[100], Ro=(0.0024-0.0029)Ohmcm
5″Ø×273mm ingot n-type Si:As[100], Ro=(0.0024-0.0040)Ohmcm
5″Ø×388mm ingot n-type Si:As[100], Ro=(0.0029-0.0044)Ohmcm
5″Ø×340mm ingot n-type Si:As[100], Ro=(0.0032-0.0044)Ohmcm
5″Ø×290mm ingot [...]
2019-03-08meta-author
We are an expert of semiconductor wafers in semiconductor industry, and we offer technology support and wafers selling for thousands of univerisities and industrial customers by our decades experience, including Cornell University, Stanford Univeristy,Peking University,Shandong Univerity, university of south carolina,Caltech Faraon lab（USA）,University of California, [...]
2019-10-29meta-author
PAM XIAMEN offers SOS (silicon on Sapphire).
Silicon-on-Sapphire (11-02, R Plane ), 100mm Dia x 0.46mm,2sp, Film: 0.5 um thick,
Silicon-on-Sapphire (11-02, R Plane ), 100mm Dia x 0.46mm,2sp, Film: 0.6 um thick,
Silicon-on-Sapphire (11-02, R Plane ), 100mm Dia x 0.46mm,2sp, Film: 1.0 [...]
2019-04-28meta-author
![$[000\bar{1}]$](https://cdn.iopscience.com/images/1347-4065/57/4S/04FG01/SS17023if001.gif)
. The surface of the GaN epitaxial layers on the 0.1°-off substrate consisted of pyramidal hillocks and contained oxygen (>1017 cm−3) and carbon (>1016 cm−3) impurities. The residual carbon and oxygen impurities decreased to <1016 cm−3 when the off-angle of the m-plane GaN substrate was increased. The leakage current of the 0.1°-off m-plane GaN Schottky diodes originated from the +c facet of the pyramidal hillocks. The leakage current was efficiently suppressed through the use of an off-angle that was observed to be greater than 1.1°. The off-angle of the m-plane GaN substrate is critical in obtaining high-performance Schottky diodes.