PAM XIAMEN offers 100mm Si wafers. Please send us email at sales@powerwaywafer.com if you need other specs and quantity.
Item | Material | Orient. | Diam (mm) |
Thck (μm) |
Surf. | Resistivity Ωcm |
Comment |
PAM2535 | n–type Si:P | [100] | 4″ | 350 | P/P | 20–23 | SEMI Prime, 14 wafes with 2 flats, 7 with 1 flat, Empak cst |
PAM2536 | n–type Si:P | [100] | 4″ | 525 | P/E | 10–30 | SEMI, 2Flats, in Empak cassettes of 7 & 7 wafers |
PAM2537 | n–type Si:P | [100] | 4″ | 5800 | P/E | 10–100 | SEMI Prime, 2Flats, Individual cst |
PAM2538 | n–type Si:P | [100] | 4″ | 5800 | P/E | 10–100 | SEMI Prime, 2Flats, Individual cst |
PAM2539 | n–type Si:P | [100–4° towards[111]] | 4″ | 525 | P/E | 9–11 | SEMI Prime, 2Flats, Empak cst |
PAM2540 | n–type Si:P | [100] | 4″ | 525 | P/E | 7–11 | SEMI Prime, 2Flats, Empak cst |
PAM2541 | n–type Si:P | [100] | 4″ | 525 | P/E | 7–11 | SEMI Prime, 2Flats, Empak cst |
PAM2542 | n–type Si:P | [100] | 4″ | 224 | P/E | 5–10 | SEMI Flats (two), Empak cst, Cassette of 12 + 13 wafers |
PAM2543 | n–type Si:P | [100] | 4″ | 224 | BROKEN | 5–10 | SEMI Test, 2Flats, Empak cst |
PAM2544 | n–type Si:P | [100] | 4″ | 500 | P/P | 4–6 | SEMI Prime, 2Flats, Empak cst |
PAM2545 | n–type Si:P | [100] | 4″ | 350 ±10 | P/P | 3–5 | SEMI Prime, 2Flats, in Empak cassettes of 5 & 8 wafers |
PAM2546 | n–type Si:P | [100] | 4″ | 350 | P/P | 3–5 | SEMI Test, 2Flats, Empak cst, Haze, pits, scratches |
PAM2547 | n–type Si:P | [100] | 4″ | 450 | C/C | 3–5 | SEMI Prime, 2Flats, Empak cst |
PAM2548 | n–type Si:P | [100] | 4″ | 525 | P/E | 3–9 | SEMI Prime, 2Flats, Empak cst, TTV<5μm |
PAM2549 | n–type Si:P | [100] | 4″ | 500 ±10 | P/P | 2–5 | SEMI TEST (wafers have spots resembling water splashes, which do not come off), 2Flats, in hard cassettes of 4, 5 & 5 wafers |
PAM2550 | n–type Si:P | [100] | 4″ | 500 ±10 | P/P | 2–5 | SEMI Prime, 2Flats, in Empak cassettes of 6, 6 & 7 wafers |
PAM2551 | n–type Si:P | [100] | 4″ | 525 ±10 | P/P | 2–6 | SEMI Prime, 1Flat, Empak cst |
PAM2552 | n–type Si:P | [100] | 4″ | 250 ±5 | P/P | 1–100 | SEMI Prime, TTV<3μm, Empak cst |
PAM2553 | n–type Si:P | [100] | 4″ | 280 ±2 | P/P | 1–10 | SEMI Prime, 1Flat, Empak cst, TTV<2μm |
PAM2554 | n–type Si:P | [100] | 4″ | 280 | P/P | 1–5 | SEMI Prime, 2Flats, Empak cst |
PAM2555 | n–type Si:P | [100] ±0.2° | 4″ | 400 ±10 | P/P | 1–3 | SEMI Prime, 1Flat, Empak cst, TTV<5μm |
PAM2556 | n–type Si:P | [100] | 4″ | 400 ±10 | P/P | 1–10 | SEMI Prime, 2Flats, Empak cst, TTV<5μm |
PAM2557 | n–type Si:P | [100] | 4″ | 400 ±5 | P/P | 1–10 | SEMI Prime, 1Flat, Empak cst, TTV<1μm, Bow<20μm, Warp<20μm |
PAM2558 | n–type Si:P | [100] ±1° | 4″ | 400 ±10 | P/P | 1–10 | SEMI Test, 2Flats, Empak cst, TTV<5μm |
PAM2559 | n–type Si:P | [100] | 4″ | 400 | P/E | 1–6 | SEMI Prime, 2Flats, Empak cst |
PAM2560 | n–type Si:P | [100] ±1° | 4″ | 465 ±10 | E/E | 1–3 | SEMI, 1Flat, Empak cst |
PAM2561 | n–type Si:P | [100] | 4″ | 500 ±10 | P/P | 1–100 | SEMI, 2Flats, Empak cst |
PAM2562 | n–type Si:P | [100] | 4″ | 525 | P/E | 0.3–0.5 | SEMI Prime, 2Flats, Empak cst, TTV<5μm |
PAM2563 | n–type Si:P | [100] | 4″ | 525 | P/E | 0.3–0.5 | SEMI Prime, 2Flats, Empak cst |
PAM2564 | n–type Si:P | [100] | 4″ | 525 | P/E | 0.3–0.5 | SEMI Prime, 2Flats, Empak cst |
PAM2565 | n–type Si:P | [100] | 4″ | 300 | P/E | 0.29–0.31 | SEMI Prime, 2Flats, Empak cst |
PAM2566 | n–type Si:P | [100] | 4″ | 200 | P/P | 0.10–0.15 | SEMI Test, 2Flats, Empak cst, Not sealed both sides scratched |
PAM2567 | n–type Si:P | [100] | 4″ | 200 | P/P | 0.10–0.15 | SEMI Test, 2Flats, Empak cst, Both sides with scratches |
PAM2568 | n–type Si:P | [100] | 4″ | 200 | P/E | 0.10–0.15 | SEMI Prime, 2Flats, Empak cst, Front–side Prime, Back–side Test grade polish |
PAM2569 | n–type Si:Sb | [100–6° towards[110]] ±0.5° | 4″ | 525 | P/E | 0.015–0.020 | SEMI Prime, 2Flats, Empak cst |
PAM2570 | n–type Si:Sb | [100] | 4″ | 305 ±3 | P/P | 0.010–0.025 | SEMI Prime, 2Flats, Empak cst, TTV<1μm |
PAM2571 | n–type Si:Sb | [100] | 4″ | 525 | P/E | 0.01–0.02 | SEMI Prime, 2Flats, Empak cst |
PAM2572 | n–type Si:Sb | [100] | 4″ | 525 | P/E | 0.01–0.02 | SEMI Prime, 2Flats, Empak cst |
PAM2573 | n–type Si:As | [100] | 4″ | 545 | E/E | 0.002–0.004 | SEMI, 1Flat, Empak cst |
PAM2574 | n–type Si:As | [100] | 4″ | 525 | PlyAP/E | 0.001–0.005 | With layer of Al2O3, ~0.1μm or ~0.05μm thick, Wafers with a matrix of Polycrystalline Silicon dots, Empak cst, |
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PAM2575 | n–type Si:As | [100] | 4″ | 525 | P/P | 0.001–0.005 | SEMI Prime, 1Flat, Empak cst |
PAM2576 | n–type Si:As | [100] | 4″ | 525 | P/E | 0.001–0.005 | SEMI Test (Chipped edge), 2Flats, Empak cst |
PAM2577 | n–type Si:As | [100] | 4″ | 525 | P/E | 0.001–0.005 | SEMI Prime, 2Flats, Empak cst |
PAM2578 | n–type Si:As | [100] | 4″ | 525 | P/E | 0.001–0.005 | SEMI Prime, 2Flats, Empak cst, TTV<4μm, Bow<10μm, Warp<25μm |
PAM2579 | n–type Si:As | [100] | 4″ | 550 ±10 | P/P | 0.001–0.005 | SEMI Prime, 2Flats, Empak cst |
PAM2580 | n–type Si:Sb | [211] ±0.5° | 4″ | 1,500 ±15 | P/P | 0.01–0.02 | SEMI Prime, 1Flat, Empak cst, TTV<1μm |
PAM2581 | n–type Si:Sb | [211] ±0.5° | 4″ | 1600 | C/C | 0.01–0.02 | SEMI Test, 1Flat, Empak cst, Wafers can be polished for additional fee |
PAM2582 | n–type Si:P | [111] | 4″ | 1200 | P/P | 35–85 | SEMI Prime, 2Flats, Empak cst |
PAM2583 | n–type Si:P | [111] ±0.5° | 4″ | 1500 | P/E | >20 {24–29} | SEMI Prime, 2Flats, TTV<5μm, in Empak cassettes of 2 wafers |
PAM2584 | n–type Si:P | [111] ±0.5° | 4″ | 250 | P/E | 18–25 | SEMI Prime, 2Flats, Empak cst |
PAM2585 | n–type Si:P | [111] ±0.5° | 4″ | 500 | P/P | 11–15 | SEMI Prime, 2Flats, Empak cst, Both–sides Epi Ready polished |
PAM2586 | n–type Si:P | [111] ±0.5° | 4″ | 525 | P/E | 1–5 | SEMI Prime, 2Flats, Empak cst |
PAM2587 | n–type Si:P | [111] ±0.5° | 4″ | 750 | P/P | 1–100 | SEMI Prime, 2Flats, Empak cst, TTV<5μm |
PAM2588 | n–type Si:P | [111] ±0.5° | 4″ | 1000 | P/E | 1–10 | SEMI Prime, 2Flats, in Empak cassettes of 3, 3 & 4 wafers. |
PAM2589 | n–type Si:P | [111] ±0.5° | 4″ | 1000 | P/E | 1–10 | SEMI Prime, 2Flats, Empak cst |
PAM2590 | n–type Si:P | [111] ±0.5° | 4″ | 10000 | P/E | 1–100 {8.3–9.9} | Prime, NO Flats, Individual cst, groups of 5 wafers |
PAM2591 | n–type Si:P | [111] ±1.0° | 4″ | 525 | P/E | 0.3–50.0 | SEMI Prime, 2Flats, Empak cst |
PAM2592 | n–type Si:P | [111] ±1.0° | 4″ | 565 ±10 | E/E | 0.3–50.0 | SEMI Prime, Empak cst |
PAM2593 | n–type Si:Sb | [111] | 4″ | 525 | P/E | 0.016–0.020 | SEMI Prime, 2Flats, Empak cst |
PAM2594 | n–type Si:Sb | [111] | 4″ | 525 | P/E | 0.016–0.020 | SEMI Prime, 2Flats, Empak cst |
For more information, please visit our website: https://www.powerwaywafer.com,
send us email at sales@powerwaywafer.com and powerwaymaterial@gmail.com
Found in 1990, Xiamen Powerway Advanced Material Co., Ltd (PAM-XIAMEN) is a leading manufacturer of semiconductor material in China.PAM-XIAMEN develops advanced crystal growth and epitaxy technologies, manufacturing processes, engineered substrates and semiconductor devices.PAM-XIAMEN’s technologies enable higher performance and lower cost manufacturing of semiconductor wafer.
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