PAM XIAMEN offers 6″CZ Prime Silicon Wafer-1
Item8, 25pcs
Silicon wafer:
i. Diameter: 150 mm ± 0.5 mm,
ii. Thickness: 675μm ±25μm
iii. Doping: P type
iv. Orientation: (111) ± 0.5°
v. TTV: ≤ 5 μm
vi. Bow and Warp: ≤ 20 μm
Growth: CZ
Grade: Prime
Resistivity: 1 Ohm-cm to 10 Ohm-cm
Surface: single side polished
Flats: SEMI Standard
Surface roughness: ≤ 5Å
For more information, send us email at sales@powerwaywafer.com and powerwaymaterial@gmail.com.
Thermal oxides on the Ga-face of low defect density bulk gallium nitride (GaN) were controllably produced under varying conditions and subsequently analyzed. The thermal oxidation was performed in a dry oxygen atmosphere at different temperatures and different oxidation times. Each oxide layer was identified [...]
Growth of 3C–SiC films on Si substrates by vapor–liquid–solid tri-phase epitaxy Cubic SiC films (3C–SiC) were deposited on (111) Si substrates by a vapor–liquid–solid tri-phase growth method. In such a process a thin copper layer, which was evaporated on the Si substrate prior to the [...]
PAM XIAMEN offers Stainless Steel Substrate ( Polycrystaline) . Stainless Steel Substrate: 1″ Dia x 0.3 mm, as cold rolling Substrate dimension: 25.4 diameter x 0.3 mm thickness, ( 1″ Dia. x0.3 mm) Properties Yield Strength:（N/mm2）≥205 Tensile strength :≥520 Elogation: （%）≥40 Density : 7.93 g·cm-3 Resistivity: 0.73 Ω·mm2·m-1 [...]
PAM XIAMEN offers 80+1mm FZ Si Ingot-3 FZ Si Ingot Diameter 80+1mm, N-type, <111>±2° 10,000Ωcm>Resistivity>3000Ωcm Oxygen/Carbon Content 10Е16см-3 The silicon content not less than 99.999999% Length 150-480mm MCC lifetime>1000μs The dislocation density not, Swirl not For more information, send us email at sales@powerwaywafer.com and powerwaymaterial@gmail.com
Ultra High Flux 2-D CdZnTe Monolithic Detector Arrays for X-Ray Imaging Applications The performance of 2-D CdZnTe monolithic detector arrays designed for high flux X-ray imaging applications was studied. For the first time we have obtained 5 times 106 counts/s/mm2 count-rate for aCdZnTe pixelated detector array. This count-rate is more [...]
PAM XIAMEN offers4″ FZ Prime Silicon Wafer-6 Substrate Monocrystalline Silicon Diameter 100 ±0.3mm Growth method Fz Lifetime>1000µsec Thickness 600± 25µm Type/DopantN/Phosphorus Orientation[110]±0.5° Resistivity>5,000 Ωcm TTV<10µm Bow/Warp<40µm Primary Flat Location@[111]±<0.25° Primary Flat Length 32.5± 2.5mm Secondary Flat Location@[111]70.5° CW from primary flat Front side finishMirror Polish Edge rounded per SEMI standard *Exception: No edge round on primary flat* Back side finish Mirror [...]
