80+1mm FZ Si Ingot-4

PAM XIAMEN offers 80+1mm FZ Si Ingot-4

FZ Si Ingot
Diameter 80+1mm, N-type, <111>±2°
Resistivity 1000-3000Ωcm
Oxygen/Carbon Content 10Е16см-3
The silicon content not less than 99.999999%
Length 150-480mm
MCC lifetime>1000μs
The dislocation density not, Swirl not

For more information, send us email at sales@powerwaywafer.com and powerwaymaterial@gmail.com

2020-04-16

2″ FZ Intrinsic Silicon Wafer

PAM XIAMEN offers 2″ FZ Intrinsic Silicon Wafer Silicon, 2″ Intrinsic Orientation <100>, Resistivity >10,000Ωcm, Thickness 280±10um, DSP, TTV<5um, Bow/Warp<30um, 2 SEMI Flats, Prime Grade, Particle @0.3µm, <20 count Good surface quality for Thermal Oxide growth For more information, send us email at sales@powerwaywafer.com and powerwaymaterial@gmail.com

2021-03-17meta-author

single crystal LiTaO3

PAM XIAMEN offers single crystal LiTaO3. LiTaO3 X-cut LiTaO3 optical grade, X-cut, 10x10x0.5mm, 2 SP LiTaO3 saw grade, X-cut, 10x10x0.5mm, 1sp LiTaO3 saw grade, X-cut, 3″ Dia x 0.5mm wafer, 1sp LiTaO3, 4″ wafer, specific parameters as follows: 4″ LT Wafer Specification Diameter 100.0±0.5mm Orientation Flat (OF) 30±2mm Second Refer. Flat [...]

2019-05-08meta-author

Measurements on the spectroscopic performance of CdZnTe coplanar grid detectors

Measurements on the spectroscopic performance of CdZnTe coplanar grid detectors A performance study was performed for CdZnTe coplanar grid (CPG) detectors when used as γ-ray spectrometers. The detectors have the crystal volumes of 1, 1.6875 and 2.25 cm3, respectively. Time stability of each CdZnTe CPG detector [...]

2013-10-16meta-author CdZnTe, Coplanar grid, Detector, FWHM, Peak-to-valley

Sheet resistance measurement on AlGaN/GaN wafers and dispersion study

An important dispersion in the Rsheet measurement of AlGaN/GaN wafers was found on different samples, with or without SiN passivation. The dispersion is due to a drift of the Rsheet appearing when the sample is placed in the dark. This drift is different for each sample [...]

2013-09-15meta-author AlGaN/GaN HeMT, AlGaN/GaN wafers, Light, Sheet resistance

Types and Uses of GaAs electronic devices

GaAs epi wafer for microelectronic and optoelectronic devices PAM XIAMEN offers GaAs epi wafer for microelectronic and optoelectronic devices including MESFET HEMT, ICMMIC HBT, HALL device, visible light LED, IR LED, LD and solar cell. Electronic devices Material(layer/substrate) Application Technology Tends Material Required Digital IC (MESFETHEMT) GaAs/GaAs GaAlAs/GaAs Ultra-high-speed computers PC,ATM,Image Processing High level [...]

2019-03-15meta-author

(11-22) Plane Si-GaN Freestanding GaN Substrate

PAM-XIAMEN offers (11-22) Plane Si-GaN Freestanding GaN Substrate Item PAM-FS-GAN(11-22)- SI Dimension 5 x 10 mm2 or 5 x 20 mm2 Thickness 380+/-50um Orientation (11-22) plane off angle toward A-axis 0 ±0.5° (11-22) plane off angle toward C-axis -1 ±0.2° Conduction Type Semi-Insulating Resistivity (300K) > 106 Ω·cm TTV ≤ 10 µm BOW BOW ≤ 10 µm Surface Roughness Front side: Ra<0.2nm, epi-ready; Back side: Fine Ground or polished. Dislocation Density ≤5 x 10 6cm-2 Macro Defect Density 0 cm-2 Useable Area > 90% (edge exclusion) Package each in single wafer container, under nitrogen atmosphere, packed in class 100 clean room For more information, please contact us email at victorchan@powerwaywafer.com and powerwaymaterial@gmail.com

2020-08-20meta-author

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Float-Zone Mono-Crystalline Silicon

PAM-XIAMEN can offer float zone silicon wafer, which is obtained by Float Zone method. Monocrystalline silicon rods is got through float zone growth, and then process the monocrystalline silicon rods into silicon wafers, called float zone silicon wafers. Since the zone-melted silicon wafer is not in contact with the quartz crucible during the floating zone silicon process, the silicon material is in a suspended state. Thereby, it is less polluted during the process of floating zone melting of silicon. The carbon content and oxygen content are lower, the impurities are less, and the resistivity is higher. It is suitable for the manufacture of power devices and certain high-voltage electronic devices.
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Test Wafer Monitor Wafer Dummy Wafer

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CdZnTe (CZT) Wafer

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sales@powerwaywafer.com tech@powerwaywafer.com

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80+1mm FZ Si Ingot-4

80+1mm FZ Si Ingot-4

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