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PAM XIAMEN offers YSZ crystal. YSZ crystal is grown by “cold crucible” method. It is very difficult to get a larger size YSZ crystal. PAM XIAMEN supplies YSZ crystal wafer up to 2″ diameter. YSZ Substrate (110) YSZ (110) 0.5″x0.5″x0.5mm, 1SP YSZ (110) 0.5″x0.5″x0.5mm, [...]
Precipitation in low temperature grown GaAs The precipitation of arsenic in GaAs epitaxially grown at low temperature (LT GaAs) has been studied as a function of the post-growth annealing temperature by three independent methods: transmission electron microscopy (TEM), Raman scattering, and for the first time [...]
PAM XIAMEN offers LiTaO3 Lithium Tantalate Crystal. Major capability parameter Material purity >99.995% Crystal structure M6 Unit cell constant a=5.154Å c=13.783 Å Melt point(℃) 1650 Density 7.45(g/cm3) Hardness 5.5~6(mohs) Color Colorless Index of refraction no=2.176 ne=2.180 (633nm) Through scope 0.4~5.0mm Resistance coefficient 1015wm Dielectric [...]
PAM-XIAMEN offers silicon ingot with FZ Intrinsic undoped, MCC lifetime (Minority Charge Carrier Lifetime) more than 1000Ωcm. An intrinsic(pure) semiconductor, also called an undoped semiconductor or i-type semiconductor, is a pure semiconductor without any significant dopant species present. The number of charge carriers is therefore determined by the [...]
PAM XIAMEN offers (Gallium Nitride)GaN Template on Sapphire. C plane (0001).Gallium Nitride (GaN) Template on Sapphire,are available, this GaN templates includes N-type, P-type or semi-insulating (SI): 1.Wafer List: 2 inch N type/Si doped 5um Gallium Nitride GaN Template on Sapphire, single side polished or double side polished. [...]
PAM XIAMEN offers 4″ Silicon EPI Wafers. Substrate EPI Comment Size Type Res Ωcm Surf. Thick μm Type Res Ωcm 4″Øx525μm n- Si:As[111] 0.0010-0.0035 P/E 37 p- Si:B 35±10% P/N/N+ 4″Øx525μm n- Si:As[111] 0.0010-0.0035 P/E 16.5 n- Si:P 12.5±10% P/N/N+ 4″Øx525μm n- Si:As[111] 0.0010-0.0035 P/E 45 p- Si:B 13±10% P/N/N+ 4″Øx525μm n- Si:As[111] 0.0010-0.0035 P/E 7±1 n- Si:P 12±10% P/N/N+ 4″Øx525μm n- Si:As[111] 0.0010-0.0035 P/E 45 p- Si:B 14.5±10% P/N/N+ 4″Øx525μm n- Si:As[111] 0.0010-0.0035 P/E 7 n- Si:P 12±10% P/N/N+ 4″Øx525μm n- Si:As[111] 0.002-0.005 P/E 88 p- Si:B 80.5±10% P/N/N+ 4″Øx525μm n- Si:As[111] 0.002-0.005 P/E 88 n- Si:P 27±10% P/N/N+ 4″Øx380μm n- Si:As[111] 0.002-0.005 P/E 105 p- Si:B 0.0035±10% P/N/N+ 4″Øx380μm n- Si:As[111] 0.002-0.005 P/E 26 n- Si:P 5±10% P/N/N+ 4″Øx525μm n- Si:As[111] 0.0010-0.0035 P/E 10.15 n- Si:P 3.8±0.5 N/N/N+ 4″Øx525μm n- Si:As[111] 0.0010-0.0035 P/E 6.8±0.8 n- Si:P 0.55±0.15 N/N/N+ 4″Øx380μm n- Si:As[111] 0.004-0.008 P/EOx 16.5 n- Si:P 35 ±10% N/N+ 4″Øx508μm n- Si:As[111] 0.002-0.005 P/E 19±1.3 n- Si:P 25±5 N/N/N+ 4″Øx508μm n- Si:As[111] 0.002-0.005 P/E 54.5±3.6 n- Si:P 4.4 N/N/N+ 4″Øx380μm n- Si:As[111] 0.001-0.005 P/EOx 20 n- Si:P 270 ±10% N/N+ 4″Øx400μm n- Si:As[111] 0.001-0.005 P/E 20 n- Si:P 0.09 ±10% N/N+ 4″Øx400μm n- [...]