The effect of hydrogen plasma treatment on the Au–CdZnTe interface

This paper investigates the hydrogen plasma treatment effects on the interface of Au/CdZnTe contact. Hydrogen plasma with high energy is the smallest and lightest atomic mass, which is easy to enter into the crystal surface to fill the vacancy defects. The Au/CdZnTe samples were treated by the microwave hydrogen plasma with the power of 60 W (average power density of 0.5 W/cm²) and the frequency of 13.6 MHz under different treatment times. Scanning electron microscope (SEM), current–voltage (I–V) and adhesion strength measurement were performed to analyze the interface properties of Au/CdZnTe before and after the hydrogen plasma treatment. The results show that the hydrogen plasma treatment can reduce the surface leakage current, decrease the point defects and improve the performance of the electrode contacts.

Highlights

► The Au/CZT samples were treated by the microwave hydrogen plasma.

► The hydrogen plasma treatment of Au/CZT for 4–8 min improved the contact performance.

► After the hydrogen plasma treatment over 16 min, the properties of Au/CZT grow worse.

Fig. 1. I–V curves of Au/CZT samples at different hydrogen plasma treatment time.

Source: Surface and Coatings Technology

If you need more information about The effect of hydrogen plasma treatment on the Au–CdZnTe interface, please visit our website:https://www.powerwaywafer.com/, send us email at [email protected] or [email protected].

2013-11-06 CdZnTe, Hydrogen plasma, Interface properties

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